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1
Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard
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Patrick Girard:

Power-Aware Testing and Test Strategies for Low Power Devices - new book

2001, ISBN: 9781441909275

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… More...

Shipping costs:Envío gratis. (EUR 0.00) Buchhandlung Kühn GmbH
2
Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - Girard, Patrick
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Girard, Patrick:

Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - hardcover

2009, ISBN: 9781441909275

[ED: Gebunden], [PU: Springer US], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate … More...

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3
Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard
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Patrick Girard:
Power-Aware Testing and Test Strategies for Low Power Devices - new book

2001

ISBN: 9781441909275

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… More...

Shipping costs:Envío gratis. (EUR 0.00) buchversandmimpf2000
4
Power-Aware Testing and Test Strategies for Low Power Devices
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Power-Aware Testing and Test Strategies for Low Power Devices - Paperback

2010, ISBN: 9781441909275

*Power-Aware Testing and Test Strategies for Low Power Devices* - 2010 edition / gebundene Ausgabe für 160.49 € / Aus dem Bereich: Bücher, Wissenschaft, Technik Medien > Bücher nein Buch … More...

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5
Power-Aware Testing and Test Strategies for Low Power Devices - Girard, Patrick, Nicola Nicolici  und Xiaoqing Wen
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Girard, Patrick, Nicola Nicolici und Xiaoqing Wen:
Power-Aware Testing and Test Strategies for Low Power Devices - First edition

2009, ISBN: 9781441909275

[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, Buchrücken leicht geknickt, 1. Auflage 2010 5664520/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, Banküb… More...

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Details of the book
Power-Aware Testing and Test Strategies for Low Power Devices

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Details of the book - Power-Aware Testing and Test Strategies for Low Power Devices


EAN (ISBN-13): 9781441909275
ISBN (ISBN-10): 1441909273
Hardcover
Paperback
Publishing year: 2009
Publisher: Springer Nature Singapore
363 Pages
Weight: 0,717 kg
Language: eng/Englisch

Book in our database since 2009-11-13T14:04:16-05:00 (New York)
Detail page last modified on 2024-04-18T20:28:16-04:00 (New York)
ISBN/EAN: 9781441909275

ISBN - alternate spelling:
1-4419-0927-3, 978-1-4419-0927-5
Alternate spelling and related search-keywords:
Book author: girard patrick, xiaoqi
Book title: test, the power now


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