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Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard
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Patrick Girard:
Power-Aware Testing and Test Strategies for Low Power Devices - new book

ISBN: 9781441909282

ID: 9781441909282

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. Power-Aware Testing and Test Strategies for Low Power Devices: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. Electronic Testing Low Power Design Low Power Testing Nanoscale Testing Nicolici Power Aware Testing Semiconductor Testing VLSI Wen power management semiconductor testing B Computer-Aided Engineering (CAD, CAE) and Design Circuits and System, Springer US

New book Rheinberg-Buch.de
Ebook, Englisch, Neuware Shipping costs:Ab 20¤ Versandkostenfrei in Deutschland, Sofort lieferbar, DE. (EUR 0.00)
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(*) Book out-of-stock means that the book is currently not available at any of the associated platforms we search.
Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard
book is out-of-stock
(*)
Patrick Girard:
Power-Aware Testing and Test Strategies for Low Power Devices - new book

ISBN: 9781441909282

ID: 9781441909282

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. Power-Aware Testing and Test Strategies for Low Power Devices: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. B Low Power Design Electronic Testing Low Power Testing Power Aware Testing power management testing Nanoscale Testing Nicolici Computer-Aided Engineering (CAD, CAE) and Design semiconductor VLSI Circuits and Systems Wen Engineering Semicon, Springer US

New book Rheinberg-Buch.de
Ebook, Englisch, Neuware Shipping costs:Ab 20¤ Versandkostenfrei in Deutschland, Sofort lieferbar, DE. (EUR 0.00)
Details...
(*) Book out-of-stock means that the book is currently not available at any of the associated platforms we search.
Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard; Nicola Nicolici; Xiaoqing Wen
book is out-of-stock
(*)
Patrick Girard; Nicola Nicolici; Xiaoqing Wen:
Power-Aware Testing and Test Strategies for Low Power Devices - new book

ISBN: 9781441909282

ID: 9781441909282

Engineering; Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design Electronic Testing, Low Power Design, Low Power Testing, Nanoscale Testing, Nicolici, Power Aware Testing, Semiconductor Testing, VLSI, Wen, power management, semiconductor, testing Books eBook, Springer Science+Business Media

New book Springer.com
Power-aware testing methods for conventional circuits and systems are explored in this volume, while providing safe testing techniques without compromising reliability. State-of-the-art industrial practices are discusses, as well as EDA solutions. Shipping costs: EUR 0.00
Details...
(*) Book out-of-stock means that the book is currently not available at any of the associated platforms we search.
Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard; Nicola Nicolici; Xiaoqing Wen
book is out-of-stock
(*)
Patrick Girard; Nicola Nicolici; Xiaoqing Wen:
Power-Aware Testing and Test Strategies for Low Power Devices - new book

ISBN: 9781441909282

ID: 9781441909282

Engineering; Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design Electronic Testing, Low Power Design, Low Power Testing, Nanoscale Testing, Nicolici, Power Aware Testing, Semiconductor Testing, VLSI, Wen, power management, semiconductor, testing Books eBook, Springer Nature

New book Springer.com
Power-aware testing methods for conventional circuits and systems are explored in this volume, while providing safe testing techniques without compromising reliability. State-of-the-art industrial practices are discusses, as well as EDA solutions. Shipping costs:zzgl. Versandkosten., plus shipping costs
Details...
(*) Book out-of-stock means that the book is currently not available at any of the associated platforms we search.
Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard;  Patrick Girard;  Nicola Nicolici;  Nicola Nicolici;  Xiaoqing Wen;  Xiaoqing Wen
book is out-of-stock
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Patrick Girard; Patrick Girard; Nicola Nicolici; Nicola Nicolici; Xiaoqing Wen; Xiaoqing Wen:
Power-Aware Testing and Test Strategies for Low Power Devices - First edition

2010, ISBN: 9781441909282

ID: 21682252

[ED: 1], Auflage, eBook Download (PDF), eBooks, [PU: Springer-Verlag]

New book Lehmanns.de
Shipping costs:Download sofort lieferbar, , Versandkostenfrei innerhalb der BRD (EUR 0.00)
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