1996, ISBN: 3211828745
[EAN: 9783211828748], Neubuch, [PU: Springer Vienna Nov 1996], MATERIALPRÜFUNG; MIKRO.; ABSORPTION; TRANSMISSION; DIFFRACTION; ELECTRONMICROSCOPE; ELECTRONMICROSCOPY; GLASS; IMAGING; MICR… More...
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1996, ISBN: 3211828745
[EAN: 9783211828748], Neubuch, [SC: 12.02], [PU: Springer Vienna], MATERIALPRÜFUNG; MIKRO.; ABSORPTION; TRANSMISSION; DIFFRACTION; ELECTRONMICROSCOPE; ELECTRONMICROSCOPY; GLASS; IMAGING; … More...
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[EAN: 9783211828748], Neubuch, [SC: 0.0], [PU: Springer Vienna], MATERIALPRÜFUNG; MIKRO.; ABSORPTION; TRANSMISSION; DIFFRACTION; ELECTRONMICROSCOPE; ELECTRONMICROSCOPY; GLASS; IMAGING; MI… More...
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1996, ISBN: 3211828745
Softcover reprint of the original 1st ed. 1996 Kartoniert / Broschiert Materialprüfung, Mikro..., Laserphysik, Analytische Chemie, Spektroskopie, Spektrochemie, Massenspektrometrie, Phy… More...
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1996, ISBN: 9783211828748
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Buch, Softcover, Softcover reprint of the original 1st ed. 1996, [PU: Springer Wien], Springer Wien, 1996
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1996, ISBN: 3211828745
[EAN: 9783211828748], Neubuch, [PU: Springer Vienna Nov 1996], MATERIALPRÜFUNG; MIKRO.; ABSORPTION; TRANSMISSION; DIFFRACTION; ELECTRONMICROSCOPE; ELECTRONMICROSCOPY; GLASS; IMAGING; MICR… More...
1996, ISBN: 3211828745
[EAN: 9783211828748], Neubuch, [SC: 12.02], [PU: Springer Vienna], MATERIALPRÜFUNG; MIKRO.; ABSORPTION; TRANSMISSION; DIFFRACTION; ELECTRONMICROSCOPE; ELECTRONMICROSCOPY; GLASS; IMAGING; … More...
1996
ISBN: 3211828745
[EAN: 9783211828748], Neubuch, [SC: 0.0], [PU: Springer Vienna], MATERIALPRÜFUNG; MIKRO.; ABSORPTION; TRANSMISSION; DIFFRACTION; ELECTRONMICROSCOPE; ELECTRONMICROSCOPY; GLASS; IMAGING; MI… More...
1996, ISBN: 3211828745
Softcover reprint of the original 1st ed. 1996 Kartoniert / Broschiert Materialprüfung, Mikro..., Laserphysik, Analytische Chemie, Spektroskopie, Spektrochemie, Massenspektrometrie, Phy… More...
1996, ISBN: 9783211828748
Paperback
Buch, Softcover, Softcover reprint of the original 1st ed. 1996, [PU: Springer Wien], Springer Wien, 1996
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Details of the book - Microbeam and Nanobeam Analysis
EAN (ISBN-13): 9783211828748
ISBN (ISBN-10): 3211828745
Paperback
Publishing year: 1996
Publisher: Springer Wien
Book in our database since 2007-06-02T16:05:40-04:00 (New York)
Detail page last modified on 2024-02-27T07:15:21-05:00 (New York)
ISBN/EAN: 3211828745
ISBN - alternate spelling:
3-211-82874-5, 978-3-211-82874-8
Alternate spelling and related search-keywords:
Book author: benoit francois, van dack, werner helmut, wernisch, johann franc, bress, jean francois
Book title: mikrochimica acta, supplementa, microbeam analysis
Information from Publisher
Author: Daniele Benoit; Jean-Francois Bresse; Luc Van't dack; Helmut Werner; Johann Wernisch
Title: Mikrochimica Acta Supplementa; Microbeam and Nanobeam Analysis
Publisher: Springer; Springer Wien
643 Pages
Publishing year: 1996-11-06
Vienna
Language: English
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
Available
XI, 643 p. 98 illus., 4 illus. in color.
BC; Hardcover, Softcover / Chemie/Theoretische Chemie; Analytische Chemie; Verstehen; Absorption; Transmission; diffraction; electron microscope; electron microscopy; glass; imaging; microscopy; scanning electron microscope; semiconductor; spectroscopy; synchrotron radiation; Analytical Chemistry; Physical Chemistry; Condensed Matter Physics; Spectroscopy; Laser; Surfaces, Interfaces and Thin Film; Physikalische Chemie; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Spektroskopie, Spektrochemie, Massenspektrometrie; Laserphysik; Materialwissenschaft; EA
Monte Carlo Simulation Techniques for Quantitative X-Ray Microanalysis.- Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications.- Use of Soft X-Rays in Microanalysis.- Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region.- Synchrotron Radiation Induced X-ray Microfluorescence Analysis.- Particle-Induced X-Ray Emission — A Quantitative Technique Suitable for Microanalysis.- Cathodoluminescence Microscopy and Spectroscopy of Semiconductors and Wide Bandgap Insulating Materials.- Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS).- Three-Dimensional Nanoanalysis with the Tomographic Atom-Probe.- Microanalysis at Atomic Resolution.- Composition of Vanadium Carbides Formed by Solidification in Fe-V-C-M Alloys: Influence of Additions (M = Al, Cu, Mo).- Electron Transmission Coefficient for Oblique Angle of Incidence.- Depth Distribution Function for Oblique Angle of Incidence.- Simulation of EDS Spectra Using X-RES Software.- On the Use of the GeL? Line in Thin Film X-Ray Microanalysis of Si1-x Gex/Si Heterostructures.- Computer Simulations of the X-Ray Intensity Distribution from Submicron Particles Embedded in a Matrix.- Determination of Rare Earth Elements in Biological and Mineral Apatite by EPMA and LAMP-ICP-MS.- Quantitative Analysis of the Compound Layer of Plasma Nitrided Pure Iron.- Correction of the Edge Effect in Auger Electron Microscopy.- Low Energy Imaging of Nonconductive Surfaces in SEM.- Investigation of the Bonding Mechanism of Glass Ceramic Layers on Metal Alloys.- Monte Carlo Method for Quantitative Analysis of Bulk and Layered Samples.- SIMS Linescan Profiling of Chemically Bevelled Semiconductors: a Method of Overcoming Ion Beam Induced Segregation in DepthProfiling.- Experimental Verification of Theoretical Models Simulating the Temperature Increase in EPMA of Glass.- Quantitation of Mineral Elements of Different Fruit Pollen Grains.- Electron Beam Induced Migration of Alkaline Ions in Silica Glass.- Application of the Boltzmann Transport Equation in the Thickness Determination of Thin Films.- Characterisation of the Shape of Microparticles via Fractal and Fourier Analyses of Scanning Electron Microscope Images.- Calculation of the Surface Ionisation Using Analytical Models of Electron Backscattering.- Thickness Determination of Thin Insulating Layers.- High Energy and Angular Resolution Dynamic Secondary Ion Mass Spectrometry.- EPMA and Mass Spectrometry of Soil and Grass Containing Radioactivity from the Nuclear Accident at Chernobyl.- Application of a New Monte Carlo Simulation Algorithm to Electron Probe Microanalysis.- Topography Development on Single Crystal MgO Under Ion Beam Bombardment.- Determination of SPM TIP Shape Using Polystyrene Latex Balls.- Combined Characterization of Nanostructures by AEM and STM.- Study of Quasi-Fractal Many-Particle-Systems and Percolation Networks by Zero-Loss Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Digital Image Analysis.- Calculation of Bremsstrahlung Spectra for Multilayer Samples.- Thickness Measurement of Thin Films by EPMA — Influence of ? (0), MAC’s and Substrate.- A Simple Procedure to Check the Spectral Response of an EDX Detector.- Virtual WDS.- Monte Carlo Simulation Program with a Free Configuration of Specimen and Detector Geometries.- Barriers to Energy Dispersive Spectrometry with Low Energy X-Rays.- Measurements of Ga1-xAlxAs Layers on GaAs with EDS.- The Relative Intensity Factor for La Radiation Considering the Different Mass Absorptionof La and L? Radiation.- Determination of the Solubility of Cerium in BaTiO3 by Quantitative WDS Electron Probe Microanalysis.- Simulation of X-Ray Diffraction Profiles of Gradually Relaxed Epilayers.- Monte Carlo Simulation of Electron Scattering for Arbitrary 2D Structures Using a Modified Quadtree Geometry Discretization.- Chemical-Bond Characterization of Nanostructures by EELS.- Local Determination of Carbon by Combining Beta-Autoradiography and Electron Microprobe Analysis.- The Check of the Elastic Scattering Model in Monte-Carlo Simulation.- True Colour X-Ray Vision for Electron Microscopy and Microanalysis.- Determination of the Oxidation States of Nb by Auger Electron Spectroscopy.- Study by SIMS of the 54Cr and 18O Diffusion in Cr2 O3 and in Cr2O3 Scales.- Comparison of Back-Foil Scanning X-Ray Microfluorescence and Electron Probe X-Ray Microanalysis for the Elemental Characterisation of Thin Coatings.- Electron Probe X-Ray Microanalysis of Coatings.- Analysis of Layers: X-Ray Maps of Change in Thickness Obtained by Electron Macroprobe.- Comparison of Simulated and Experimental Auger Intensities of Au, Pt, Ni and Siin Absolute Units.- Practical Aspects and Applications of EPMA at Low Electron Energies.- Oxidation and Reduction Processes of Be/BeO Induced by Electrons.More/other books that might be very similar to this book
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