2001, ISBN: 9781441909275
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… More...
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Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - hardcover
2009, ISBN: 9781441909275
[ED: Gebunden], [PU: Springer US], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate … More...
booklooker.de |
2001, ISBN: 9781441909275
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… More...
booklooker.de |
2010, ISBN: 9781441909275
*Power-Aware Testing and Test Strategies for Low Power Devices* - 2010 edition / gebundene Ausgabe für 160.49 € / Aus dem Bereich: Bücher, Wissenschaft, Technik Medien > Bücher nein Buch … More...
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2009, ISBN: 9781441909275
[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, Buchrücken leicht geknickt, 1. Auflage 2010 5664520/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, Banküb… More...
booklooker.de |
2001, ISBN: 9781441909275
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… More...
Girard, Patrick:
Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - hardcover2009, ISBN: 9781441909275
[ED: Gebunden], [PU: Springer US], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate … More...
2001
ISBN: 9781441909275
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… More...
2010, ISBN: 9781441909275
*Power-Aware Testing and Test Strategies for Low Power Devices* - 2010 edition / gebundene Ausgabe für 160.49 € / Aus dem Bereich: Bücher, Wissenschaft, Technik Medien > Bücher nein Buch … More...
2009, ISBN: 9781441909275
[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, Buchrücken leicht geknickt, 1. Auflage 2010 5664520/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, Banküb… More...
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Details of the book - Power-Aware Testing and Test Strategies for Low Power Devices
EAN (ISBN-13): 9781441909275
ISBN (ISBN-10): 1441909273
Hardcover
Paperback
Publishing year: 2009
Publisher: Springer Nature Singapore
363 Pages
Weight: 0,717 kg
Language: eng/Englisch
Book in our database since 2009-11-13T14:04:16-05:00 (New York)
Detail page last modified on 2024-04-18T20:28:16-04:00 (New York)
ISBN/EAN: 1441909273
ISBN - alternate spelling:
1-4419-0927-3, 978-1-4419-0927-5
Alternate spelling and related search-keywords:
Book author: girard patrick, xiaoqi
Book title: test, the power now
Information from Publisher
Author: Patrick Girard; Nicola Nicolici; Xiaoqing Wen
Title: Power-Aware Testing and Test Strategies for Low Power Devices
Publisher: Springer; Springer US
363 Pages
Publishing year: 2009-11-23
New York; NY; US
Printed / Made in
Language: English
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXI, 363 p.
BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Electronic Testing; Low Power Design; Low Power Testing; Nanoscale Testing; Nicolici; Power Aware Testing; Semiconductor Testing; VLSI; Wen; power management; semiconductor; testing; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Computer-Aided Design (CAD); EA; BC
Fundamentals of VLSI Testing.- Power Issues During Test.- Low-Power Test Pattern Generation.- Power-Aware Design-for-Test.- Power-Aware Test Data Compression and BIST.- Power-Aware System-Level Test Planning.- Low-Power Design Techniques and Test Implications.- Test Strategies for Multivoltage Designs.- Test Strategies for Gated Clock Designs.- Test of Power Management Structures.- EDA Solution for Power-Aware Design-for-Test.Is the only comprehensive book on power-aware test for (low power) circuits and systems Instructs readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design for test and low-power design Incorporates detailed coverage of all levels of abstraction for power-aware testing of (low-power) circuits and systems Presents state-of-the-art industrial practices and EDA solutions Includes supplementary material: sn.pub/extras
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