ISBN: 9780306436154
The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates… More...
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1990, ISBN: 9780306436154
The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates… More...
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1990, ISBN: 9780306436154
The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates… More...
Orellfuessli.ch Nr. 11432527. Shipping costs:, wird besorgt, Lieferzeit unbekannt, zzgl. Versandkosten, Lieferzeiten außerhalb der Schweiz 3 bis 21 Werktage. (EUR 16.61) Details... |
1990, ISBN: 9780306436154
The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates… More...
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1990, ISBN: 9780306436154
Volume 33, Buch, Hardcover, 1990 ed. [PU: Kluwer Academic/Plenum Publishers], Kluwer Academic/Plenum Publishers, 1990
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ISBN: 9780306436154
The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates… More...
1990, ISBN: 9780306436154
The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates… More...
1990
ISBN: 9780306436154
The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates… More...
1990, ISBN: 9780306436154
The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates… More...
1990, ISBN: 9780306436154
Volume 33, Buch, Hardcover, 1990 ed. [PU: Kluwer Academic/Plenum Publishers], Kluwer Academic/Plenum Publishers, 1990
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Details of the book - Advances in X-Ray Analysis
EAN (ISBN-13): 9780306436154
ISBN (ISBN-10): 0306436159
Hardcover
Publishing year: 1990
Publisher: Kluwer Academic/Plenum Publishers
Book in our database since 2007-11-05T08:50:47-05:00 (New York)
Detail page last modified on 2022-01-09T14:39:21-05:00 (New York)
ISBN/EAN: 9780306436154
ISBN - alternate spelling:
0-306-43615-9, 978-0-306-43615-4
Alternate spelling and related search-keywords:
Book author: ray, charles barrett, john jenkins
Book title: advances ray analysis, ray volume
Information from Publisher
Author: Charles S. Barrett; John V. Gilfrich; Ting C. Huang; Ron Jenkins
Title: Advances in X-Ray Analysis - Volume 33
Publisher: Springer; Springer US
704 Pages
Publishing year: 1990-06-01
New York; NY; US
Language: English
85,55 € (DE)
87,95 € (AT)
106,71 CHF (CH)
Contact supplier
XX, 704 p.
BB; Hardcover, Softcover / Physik, Astronomie/Theoretische Physik; Teilchen- und Hochenergiephysik; Verstehen; Neutron; X-ray; ceramics; chemistry; diffraction; energy; heat; phase diagram; physics; plasma; radiation; semiconductor; spectroscopy; stability; surfaces; Elementary Particles, Quantum Field Theory; BC
I. Characterization of Epitaxial Thin Films and Crystal Defects by X-Ray Diffraction.- II. XRD Characterization of Polycrystalline Thin Films.- III. X-Ray Spectrometric Characterization of Thin Films.- IV. Analysis of Digital Diffraction Data Including Rietveld.- V. X-Ray Stress Analysis.- VI. Determination of Crystallite Size and Strain.- VII. Phase Identification, Structural and Quantitative Analysis by Diffraction.- VIII. X-Ray Spectrometry Data Analysis.- IX. XRF Instrumentation.- X. XRF Techniques for Hazardous Wastes and Other Applications.- Author Index.More/other books that might be very similar to this book
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9781461399681 Advances in X-Ray Analysis: Volume 15 Charles Barrett Editor (Charles Barrett)
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