Advances in X-Ray Analysis : Volume 17: Proceedings of the Twenty-Second Annual Conference on Applications of X-Ray Analysis held in Denver, August 22-24, 1973 - Paperback

EAN (ISBN-13): 9781461399773
ISBN (ISBN-10): 1461399777
Paperback
Publishing year: 2013
Publisher: Springer-Verlag New York Inc.

Book in our database since 2014-10-09T16:49:25-04:00 (New York)
Detail page last modified on 2023-06-24T18:13:09-04:00 (New York)
ISBN/EAN: 9781461399773

ISBN - alternate spelling:
1-4613-9977-7, 978-1-4613-9977-3
Alternate spelling and related search-keywords:
Book author: grant
Book title: twenty, advances ray volume

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Information from Publisher

Author: C. Grant
Title: Advances in X-Ray Analysis - Volume 17: Proceedings of the Twenty-Second Annual Conference on Applications of X-Ray Analysis held in Denver, August 22–24, 1973
Publisher: Springer; Springer US
596 Pages
Publishing year: 2013-05-28
New York; NY; US
Printed / Made in
Language: English
53,49 € (DE)
54,99 € (AT)
59,00 CHF (CH)
POD
XIV, 596 p.

BC; Hardcover, Softcover / Chemie/Physikalische Chemie; Physikalische Chemie; Verstehen; Atom; Beryllium; Diffusion; Oxidation; Platin; Silicat; Titan; X-ray; alloy; analytical chemistry; crystal; diffraction; metals; qualitative analysis; quantitative analysis; Physical Chemistry; BB; EA

Standard Reference Materials and Meaningful X-Ray Measurements.- Standard Reference Materials — Their Production and Use.- Standard Data for the Identification of Phases by X-Ray Diffraction.- Provision, Suitability and Stability of Standards for Quantitative Powder Diffractometry.- Influence of Sampling on the Quality of Analyses with Emphasis on Powders.- Variation of Standards and Sampling Requirements for Complementary Analysis Methods.- Quantitative Analysis of Clay Minerals in Drilling Mud Solids.- Factors Limiting the Use of Standard Minerals in the X-Ray Diffraction Analysis of Clays.- Role of Diffractometer Geometry in the Standardization of Polycrystalline Data.- A New X-Ray Diffraction Method for Quantitative Multicomponent Analysis.- The A1 Fe Be4 Intermetallic Phase in Beryllium.- High Speed Retained Austenite Analysis with an Energy Dispersive X-Ray Diffraction Technique.- Quantitative X-Ray Diffraction Phase Analysis of the Oxidation of Steel by a Direct Comparison Method.- Low Energy X-Ray and Electron Absorption within Solids (100–1500 eV Region).- X-Ray Fluorescence Analysis of Portland Cement Through the Use of Experimentally Determined Correction Factors.- Specimen Standards for X-Ray Spectrometric Analysis of Atmospheric Aerosols.- A Versatile X-Ray Fluorescence Method for the Analysis of Sulfur in Geologic Materials.- Sampling and Standards in a Recycled World.- X-Ray Cross-Sections in Design and Analysis of Non-Dispersive Systems.- Use of Multiple Standards for Absorption Correction and Quantitation with Frieda.- Resin-Loaded Papers — A Versatile Medium for Sampling and Standardization.- Chelating Ion Exchange Resins and X-Ray Fluorescence.- Can Regression Equations be Optimized by Finagling X-Ray Intensities.- X-Ray Fluorescence Analysis ofHigh-Temperature Super-alloys — Calibration and Standards.- Quantification of Sub-microgram Elemental Concentrations Using Micro-dot Samples.- A Rapid Direct X-Ray Fluorescence Method for Simultaneously Determining Brass Composition and Plating Weight for Brass-Plated-Steel Tire Cord Wires.- Quantitative Nondispersive X-Ray Fluorescence Analysis of Highly Radioactive Samples for Uranium and Plutonium Concentration.- The Effects of Self-Irradiation on the Lattice of 23B(80%)puO2 III.- The Effects of X-Ray Optics on Residual Stress Measurements in Steel.- X-Ray Diffraction Residual Stress Analysis Using High Precision Centroid Shift Measurement Techniques — Application to Uranium — 0.75 Weight Percent Titanium Alloy.- An X-Ray Amorphous Scattering Investigation of the Corrosion of a Pottassium Silicate Glass K20-3Si02.- A Review of X-Ray Diffraction Methods for Diffusion Studies.- Pole Figure Random Intensity Calculation Using Powder Integrated Ratios.- X-Ray Emission from Laser-Produced Plasmas.- Calculation and Measurement of Integral Reflection Coefficient Versus Wavelength of “Real” Crystals on an Absolute Basis.- X-Ray Production Cross Sections for Ti, Co, Ge, Rb and Sn by MeV Oxygen Ion Bombardment.- Some Biomedical Applications of Charged-Particle-Induced X-Ray Fluorescence Analysis.- Qualitative Analysis of the Kossel Back Reflection Pattern from Selected Semiconductors.- An Experimental Evaluation of the Atomic Number Effect.- X-Ray Emission from Thin Film Materials.- Auger Electron Emission Micrography and Microanalysis of Solid Surfaces.- A Combined Photoelectron/X-Ray Fluorescence Spectrometer.- A Spherically Bent Crystal X-Ray Spectrometer with Variable Curvature.- Measurement of the X-Ray Sensitivity of Silicon Diodes in the Energy Region 1.8 to5-0 KeV.- Development of the High Performance “Solfa” On-Line Analyser to Measure Total Sulphur in Petroleum Distillates and Residual Fuels Using Non-Dispersive X-Ray Fluorescence.- Automatic Data Acquisition and Reduction for Elemental Analysis of Aerosol Samples.- A Secondary-Source, Energy-Dispersive X-Ray Spectrometer and its Application to Quantitative Analytical Chemistry.- Author Index.