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Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
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Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel:
Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - signed or inscribed book

ISBN: 9781441909381

ID: 232793

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called static faults, but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as dynamic faults, are not covered by classical test solutions and require the dedicated test sequences presented in this book.[PU:Springer-Verlag], [PU: Springer]

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Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
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Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud:
Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - new book

2009, ISBN: 1441909389

ID: 9781441909381

In englischer Sprache. Verlag: Springer US, Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here. PC-PDF, 171 Seiten, XV Seiten, 171 Seiten, [GR: 9684 - Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik], [SW: - Anlagenbau Elektronik und Nachrichtentechnik (Kommunikationstechnik)], [Ausgabe: 2010][PU:Springer US], [PU: Springer]

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Advanced Test Methods for SRAMs - Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel
book is out-of-stock
(*)
Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel:
Advanced Test Methods for SRAMs - new book

ISBN: 9781441909381

ID: 9781441909381

Engineering; Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design Dynamic Memory Faults, Electronic Testing, Memory Testing, Nanoscale Testing, SRAM, Semiconductor Memories, Semiconductor Testing, Technologie, currmssc, design, diagnosis, electronics, semiconductor, technology, testing Books eBook, Springer Science+Business Media

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Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined her Shipping costs: EUR 0.00
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Advanced Test Methods for SRAMs - Alberto Bosio;  Luigi Dilillo;  Patrick Girard;  Serge Pravossoudovitch;  Arnaud Virazel
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Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel:
Advanced Test Methods for SRAMs - First edition

2010, ISBN: 9781441909381

ID: 21777559

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, [ED: 1], Auflage, eBook Download (PDF), eBooks, [PU: Springer-Verlag]

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Advanced Test Methods for SRAMs - Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel
book is out-of-stock
(*)
Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel:
Advanced Test Methods for SRAMs - First edition

2010, ISBN: 9781441909381

ID: 21777559

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, [ED: 1], eBook Download (PDF), eBooks, [PU: Springer US]

New book Lehmanns.de
Shipping costs:Download sofort lieferbar, , versandkostenfrei in der BRD (EUR 0.00)
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