Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / Alberto Bosio (u. a.) / Buch / XV / Englisch / 2009 / Springer US / EAN 9781441909374 - hardcover
2009, ISBN: 9781441909374
[ED: Gebunden], [PU: Springer US], Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to… More...
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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies | Alberto Bosio (u. a.) | Buch | XV | Englisch | 2009 | Springer US | EAN 9781441909374 - hardcover
2009, ISBN: 9781441909374
[ED: Gebunden], [PU: Springer US], Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to… More...
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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Paperback
2010, ISBN: 9781441909374
*Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies* - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies.… More...
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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - hardcover
2009, ISBN: 9781441909374
Springer, Gebundene Ausgabe, Auflage: 2010, 186 Seiten, Publiziert: 2009-11-04T00:00:01Z, Produktgruppe: Buch, 2.16 kg, CAD & CAM, Grafik & Multimedia, Computer & Internet, Kategorien, Bü… More...
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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - hardcover
2009, ISBN: 1441909370
[EAN: 9781441909374], Neubuch, [PU: Springer], Clean and crisp and new!, Books
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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / Alberto Bosio (u. a.) / Buch / XV / Englisch / 2009 / Springer US / EAN 9781441909374 - hardcover
2009, ISBN: 9781441909374
[ED: Gebunden], [PU: Springer US], Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to… More...
Bosio, Alberto:
Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies | Alberto Bosio (u. a.) | Buch | XV | Englisch | 2009 | Springer US | EAN 9781441909374 - hardcover2009, ISBN: 9781441909374
[ED: Gebunden], [PU: Springer US], Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to… More...
Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Paperback
2010
ISBN: 9781441909374
*Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies* - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies.… More...
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - hardcover
2009, ISBN: 9781441909374
Springer, Gebundene Ausgabe, Auflage: 2010, 186 Seiten, Publiziert: 2009-11-04T00:00:01Z, Produktgruppe: Buch, 2.16 kg, CAD & CAM, Grafik & Multimedia, Computer & Internet, Kategorien, Bü… More...
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - hardcover
2009, ISBN: 1441909370
[EAN: 9781441909374], Neubuch, [PU: Springer], Clean and crisp and new!, Books
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Details of the book - Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
EAN (ISBN-13): 9781441909374
ISBN (ISBN-10): 1441909370
Hardcover
Paperback
Publishing year: 2009
Publisher: SPRINGER NATURE
171 Pages
Weight: 0,431 kg
Language: eng/Englisch
Book in our database since 2007-07-16T13:12:18-04:00 (New York)
Detail page last modified on 2023-10-14T09:12:35-04:00 (New York)
ISBN/EAN: 9781441909374
ISBN - alternate spelling:
1-4419-0937-0, 978-1-4419-0937-4
Alternate spelling and related search-keywords:
Book author: bosio, luigi, serge, girard patrick, arnaud, generation
Book title: test, advanced method, sram
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