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Analysis and Design of Resilient VLSI Circuits - Rajesh Garg
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Rajesh Garg:
Analysis and Design of Resilient VLSI Circuits - new book

ISBN: 9781441909312

ID: 9781441909312

Mitigating Soft Errors and Process Variations This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi cant rate, making it more dif cult to design reliable VLSI circuits. Hence, it is important to ef ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant. Analysis and Design of Resilient VLSI Circuits: This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi cant rate, making it more dif cult to design reliable VLSI circuits. Hence, it is important to ef ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant. Crosstalk EDA Power Supply Variation Radiation Effects Resilient VLSI Design Soft Errors VLSI VLSI Design algorithms circuit design design automation electronic design automation modeling simulation stability B Computer-Aided Engineering (, Springer US

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Analysis and Design of Resilient VLSI Circuits als eBook Download von Rajesh Garg - Rajesh Garg
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Rajesh Garg:
Analysis and Design of Resilient VLSI Circuits als eBook Download von Rajesh Garg - new book

2010, ISBN: 9781441909312

ID: 220251922

Analysis and Design of Resilient VLSI Circuits:Mitigating Soft Errors and Process Variations. 2010. Auflage Rajesh Garg Analysis and Design of Resilient VLSI Circuits:Mitigating Soft Errors and Process Variations. 2010. Auflage Rajesh Garg eBooks > Sachthemen & Ratgeber > Computer & Internet, Springer US

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Analysis and Design of Resilient VLSI Circuits als eBook Download von Rajesh Garg - Rajesh Garg
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Rajesh Garg:
Analysis and Design of Resilient VLSI Circuits als eBook Download von Rajesh Garg - new book

2010, ISBN: 9781441909312

ID: 220251922

Analysis and Design of Resilient VLSI Circuits:Mitigating Soft Errors and Process Variations. Auflage 2010 Rajesh Garg Analysis and Design of Resilient VLSI Circuits:Mitigating Soft Errors and Process Variations. Auflage 2010 Rajesh Garg eBooks > Sachthemen & Ratgeber > Computer & Internet, Springer US

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Analysis and Design of Resilient VLSI Circuits als eBook von Rajesh Garg - Springer US
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Analysis and Design of Resilient VLSI Circuits als eBook von Rajesh Garg - new book

2010, ISBN: 9781441909312

ID: 823405825

Analysis and Design of Resilient VLSI Circuits ab 131.49 EURO Mitigating Soft Errors and Process Variations. 2010. Auflage Analysis and Design of Resilient VLSI Circuits ab 131.49 EURO Mitigating Soft Errors and Process Variations. 2010. Auflage eBooks > Sachthemen & Ratgeber > Computer & Internet, [PU: Springer]

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Analysis and Design of Resilient VLSI Circuits - Rajesh Garg
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Rajesh Garg:
Analysis and Design of Resilient VLSI Circuits - First edition

2009, ISBN: 9781441909312

ID: 21784526

Mitigating Soft Errors and Process Variations, [ED: 1], Auflage, eBook Download (PDF), eBooks, [PU: Springer-Verlag]

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