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Analysis and Design of Resilient VLSI Circuits - Rajesh Garg
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Rajesh Garg:

Analysis and Design of Resilient VLSI Circuits - hardcover

ISBN: 9781441909305

ID: 9781441909305

Mitigating Soft Errors and Process Variations This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi cant rate, making it more dif cult to design reliable VLSI circuits. Hence, it is important to ef ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant. Analysis and Design of Resilient VLSI Circuits: This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi cant rate, making it more dif cult to design reliable VLSI circuits. Hence, it is important to ef ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant. CAD - Computer Aided Design Computer Aided Design ( CAD ), Springer-Verlag Gmbh

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Analysis and Design of Resilient VLSI Circuits - Rajesh Garg#Sunil P. Khatri
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Rajesh Garg#Sunil P. Khatri:

Analysis and Design of Resilient VLSI Circuits - new book

ISBN: 9781441909305

ID: c91a52f766a02985288940ed840abc73

VLSI design has grown more challenging due to detrimental effects of radiation particle strikes and processing variations. This book describes the design of resilient VLSI circuits, presenting algorithms and techniques to analyze and mitigate design problems. This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant. Bücher / Fremdsprachige Bücher / Englische Bücher 978-1-4419-0930-5, Springer

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Analysis and Design of Resilient VLSI Circuits - Rajesh Garg#Sunil P. Khatri
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Rajesh Garg#Sunil P. Khatri:
Analysis and Design of Resilient VLSI Circuits - new book

ISBN: 9781441909305

ID: 683266889

This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant. VLSI design has grown more challenging due to detrimental effects of radiation particle strikes and processing variations. This book describes the design of resilient VLSI circuits, presenting algorithms and techniques to analyze and mitigate design problems. Buch (fremdspr.) Bücher>Fremdsprachige Bücher>Englische Bücher, Springer

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Analysis and Design of Resilient VLSI Circuits - Rajesh Garg
book is out-of-stock
(*)
Rajesh Garg:
Analysis and Design of Resilient VLSI Circuits - new book

ISBN: 9781441909305

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi cant rate, making it more dif cult to design reliable VLSI circuits. Hence, it is important to ef ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant., [SC: 0.00], Neuware, gewerbliches Angebot, 241x155x23 mm, [GW: 501g]

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Analysis and Design of Resilient VLSI Circuits - Rajesh Garg
book is out-of-stock
(*)
Rajesh Garg:
Analysis and Design of Resilient VLSI Circuits - new book

ISBN: 9781441909305

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi cant rate, making it more dif cult to design reliable VLSI circuits. Hence, it is important to ef ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant., Neuware, gewerbliches Angebot, 241x155x23 mm, [GW: 501g]

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Details of the book
Analysis and Design of Resilient VLSI Circuits
Author:

Garg, Rajesh; Khatri, Sunil P.

Title:

Analysis and Design of Resilient VLSI Circuits

ISBN:

9781441909305

This book describes the design of resilient VLSI circuits. VLSI design has become more challenging recently, due to the detrimental effects of radiation particle strikes and processing variations. This book presents algorithms to analyze the effects of these issues on the electrical behavior of VLSI circuits and circuit design techniques to mitigate the impact of these problems.

Details of the book - Analysis and Design of Resilient VLSI Circuits


EAN (ISBN-13): 9781441909305
ISBN (ISBN-10): 1441909303
Hardcover
Publishing year: 2009
Publisher: Springer-Verlag GmbH
212 Pages
Weight: 0,501 kg
Language: eng/Englisch

Book in our database since 07.12.2009 21:28:53
Book found last time on 02.03.2017 13:21:05
ISBN/EAN: 9781441909305

ISBN - alternate spelling:
1-4419-0930-3, 978-1-4419-0930-5

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