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Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard; Nicola Nicolici; Xiaoqing Wen
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Power-Aware Testing and Test Strategies for Low Power Devices - new book

2010, ISBN: 9781441909282

eBooks, eBook Download (PDF), 2010, Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate… More...

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Power-Aware Testing and Test Strategies for Low Power Devices
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ISBN: 9781441909282

*Power-Aware Testing and Test Strategies for Low Power Devices* / pdf eBook für 106.99 € / Aus dem Bereich: eBooks, Sachthemen & Ratgeber, Computer & Internet Medien > Bücher nein eBook a… More...

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Power-Aware Testing and Test Strategies for Low Power Devices - Anna Kuzio
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Power-Aware Testing and Test Strategies for Low Power Devices - new book

ISBN: 9781441909282

; PDF; Scientific, Technical and Medical > Electronics & communications engineering > Electronics engineeri, Cambridge Scholars Publishing

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Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard; Nicola Nicolici; Xiaoqing Wen
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Patrick Girard; Nicola Nicolici; Xiaoqing Wen:
Power-Aware Testing and Test Strategies for Low Power Devices - new book

2010, ISBN: 9781441909282

eBooks, eBook Download (PDF), 2010, [PU: Springer US], Springer US, 2010

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Patrick Girard; Nicola Nicolici; Xiaoqing Wen:
Power-Aware Testing and Test Strategies for Low Power Devices - new book

2010, ISBN: 9781441909282

2010, eBook Download (PDF), eBooks, [PU: Springer US]

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Power-Aware Testing and Test Strategies for Low Power Devices
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9781441909282

Details of the book - Power-Aware Testing and Test Strategies for Low Power Devices


EAN (ISBN-13): 9781441909282
ISBN (ISBN-10): 1441909281
Publishing year: 2010
Publisher: Springer-Verlag GmbH
353 Pages
Language: eng/Englisch

Book in our database since 2011-10-05T14:05:02-04:00 (New York)
Detail page last modified on 2023-06-15T03:53:26-04:00 (New York)
ISBN/EAN: 9781441909282

ISBN - alternate spelling:
1-4419-0928-1, 978-1-4419-0928-2
Alternate spelling and related search-keywords:
Book author: girard patrick, xiaoqi
Book title: test

Information from Publisher

Author: Patrick Girard; Nicola Nicolici; Xiaoqing Wen
Title: Power-Aware Testing and Test Strategies for Low Power Devices
Publisher: Springer; Springer US
363 Pages
Publishing year: 2010-03-11
New York; NY; US
Language: English
106,99 € (DE)
110,00 € (AT)
130,00 CHF (CH)
Available
XXI, 363 p.

EA; E107; eBook; Nonbooks, PBS / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Electronic Testing; Low Power Design; Low Power Testing; Nanoscale Testing; Nicolici; Power Aware Testing; Semiconductor Testing; VLSI; Wen; power management; semiconductor; testing; B; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Engineering; Computer-Aided Design (CAD); BB

Fundamentals of VLSI Testing.- Power Issues During Test.- Low-Power Test Pattern Generation.- Power-Aware Design-for-Test.- Power-Aware Test Data Compression and BIST.- Power-Aware System-Level Test Planning.- Low-Power Design Techniques and Test Implications.- Test Strategies for Multivoltage Designs.- Test Strategies for Gated Clock Designs.- Test of Power Management Structures.- EDA Solution for Power-Aware Design-for-Test.
Is the only comprehensive book on power-aware test for (low power) circuits and systems Instructs readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design for test and low-power design Incorporates detailed coverage of all levels of abstraction for power-aware testing of (low-power) circuits and systems Presents state-of-the-art industrial practices and EDA solutions Includes supplementary material: sn.pub/extras
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