. .
English
United States
Similar books
More/other books that might be very similar to this book
Search tools
Sign in
Share this book on...
Book recommendations
Latest news
Tip from find-more-books.com
Advertising
FILTER
- 0 Results
Lowest price: 43.89 €, highest price: 155.14 €, average price: 97.07 €
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - Lucille A. Giannuzzi, Fred A. Stevie, North Carolina State University
book is out-of-stock
(*)
Lucille A. Giannuzzi, Fred A. Stevie, North Carolina State University:

Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - hardcover

ISBN: 9780387231167

[SR: 2276436], Hardcover, [EAN: 9780387231167], Springer, Springer, Book, [PU: Springer], Springer, Focusing on techniques and applications, this text discusses and presents the theory related to applications and explores the applications and techniques used in FIBs and dual platform instruments., 922230, Industrial Chemistry, 278004, Chemistry, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278202, Industrial Chemistry, 278203, Ceramics & Glass, 278204, Detergents, 278205, Food & Beverage, 278207, Heavy Chemicals, 278208, Insecticide & Herbicide, 278209, Pharmaceutical Technology, 278210, Pigments, Dyestuffs & Paint, 278214, Powder, 278215, Rubber, 922268, Chemical, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278161, Applied Optics, 278162, Fibre Optics, 278164, Holography, 278165, Laser Technology, 278160, Electronics Engineering, 278141, Electronics & Communications Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278171, Other Electronic Devices, 278141, Electronics & Communications Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 922390, Engineering Physics, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278233, Materials Science, 278229, Mechanical & Materials Engineering, 278115, Engineering & Technology, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278433, Light, Optics & Laser, 278409, Physics, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278434, Particle & High-Energy Physics, 278409, Physics, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278421, Spectrum Analysis, 278409, Physics, 57, Science & Nature, 1025612, Subjects, 266239, Books, 278444, Condensed Matter, 278443, States of Matter, 278409, Physics, 57, Science & Nature, 1025612, Subjects, 266239, Books, 922952, Physics, 277889, Cosmology, 278439, Relativity, 922954, Superstings, 922868, Popular Science, 57, Science & Nature, 1025612, Subjects, 266239, Books, 564334, Scientific, Technical & Medical, 564336, Agriculture & Farming, 564338, Astronomy & Cosmology, 564340, Biology, 564342, Chemistry, 564344, Earth Sciences, 564346, Engineering, 570820, Environment, 564350, Geology, 564352, Mathematics, 564356, Medicine & Nursing, 564354, Physics, 564348, Research & Development, 564358, Veterinary Science, 1025612, Subjects, 266239, Books

Used Book Amazon.co.uk
UK Media Source
Gebraucht Shipping costs:Europa Zone 1: GBP 5,48 pro Produkt. (EUR 6.75)
Details...
(*) Book out-of-stock means that the book is currently not available at any of the associated platforms we search.
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - Lucille A. Giannuzzi, North Carolina State University
book is out-of-stock
(*)

Lucille A. Giannuzzi, North Carolina State University:

Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - hardcover

ISBN: 9780387231167

[SR: 1483260], Hardcover, [EAN: 9780387231167], Springer, Springer, Book, [PU: Springer], Springer, Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments., 227544, Electrical & Electronics, 3747, Networks, 173515, Engineering, 173507, Professional & Technical, 1000, Subjects, 283155, Books, 227550, Industrial, Manufacturing & Operational Systems, 173515, Engineering, 173507, Professional & Technical, 1000, Subjects, 283155, Books, 226704, Materials, 173515, Engineering, 173507, Professional & Technical, 1000, Subjects, 283155, Books, 13570, Chemistry, 16052551, Alkaloids, 13571, Analytic, 13511, Biochemistry, 16052341, Chemical Physics, 16052451, Chromatography, 13577, Crystallography, 13579, General & Reference, 226694, Geochemistry, 13590, Industrial & Technical, 13581, Inorganic, 16052621, Molecular Chemistry, 16052651, Nuclear Chemistry, 13585, Organic, 16052661, Photochemistry, 13588, Physical & Theoretical, 16052541, Polymers & Macromolecules, 16052401, Safety, 75, Science & Math, 1000, Subjects, 283155, Books, 226697, Electromagnetism, 16052201, Electricity, 16052241, Magnetism, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 16052321, Particle Physics, 14576, Nuclear Physics, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 14589, Optics, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 14585, Solid-State Physics, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 491732, Physics, 468216, Science & Mathematics, 465600, New, Used & Rental Textbooks, 2349030011, Specialty Boutique, 283155, Books

Used Book Amazon.com
-TextbookRush-
Gebraucht Shipping costs:plus shipping costs
Details...
(*) Book out-of-stock means that the book is currently not available at any of the associated platforms we search.
Introduction To Focused Ion Beams
book is out-of-stock
(*)
Introduction To Focused Ion Beams - new book

ISBN: 9780387231167

ID: 5931735

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. Books, Science and Geography~~Physics~~Particle & High-energy Physics, Introduction To Focused Ion Beams~~Book~~9780387231167, , , , , , , , , ,, [PU: Springer]

New book Hive.co.uk
MPN: , SKU 5931735 Shipping costs:zzgl. Versandkosten, plus shipping costs
Details...
(*) Book out-of-stock means that the book is currently not available at any of the associated platforms we search.
Introduction to Focused Ion Beams - Lucille A. Giannuzzi#Fred A. Stevie
book is out-of-stock
(*)
Lucille A. Giannuzzi#Fred A. Stevie:
Introduction to Focused Ion Beams - new book

ISBN: 9780387231167

ID: 166168307

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. Instrumentation, Theory, Techniques and Practice Buch (fremdspr.) Bücher>Fremdsprachige Bücher>Englische Bücher, Springer

New book Thalia.de
No. 6304728 Shipping costs:, Sofort lieferbar, DE (EUR 0.00)
Details...
(*) Book out-of-stock means that the book is currently not available at any of the associated platforms we search.
Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice - Giannuzzi, L. A. (Herausgeber); Stevie, F. A. (Herausgeber)
book is out-of-stock
(*)
Giannuzzi, L. A. (Herausgeber); Stevie, F. A. (Herausgeber):
Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice - hardcover

2005, ISBN: 0387231161

ID: A3782039

Gebundene Ausgabe Materialwissenschaft, SCIENCE / Physics / General, TECHNOLOGY & ENGINEERING / Materials Science, TECHNOLOGY & ENGINEERING / Optics, mit Schutzumschlag neu, [PU:Springer-Verlag GmbH]

New book Achtung-Buecher.de
REDIVIVUS Buchhandlung Hanausch Reinhard, 93053 Regensburg
Shipping costs:Versandkostenfrei innerhalb der BRD (EUR 0.00)
Details...
(*) Book out-of-stock means that the book is currently not available at any of the associated platforms we search.

< to search results...
Details of the book
Introduction to Focused Ion Beams
Author:

L. A. Giannuzzi

Title:

Introduction to Focused Ion Beams

ISBN:

9780387231167

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. TOC:The Focused Ion Beam Instrument.- Ion-Solid Interactions.- Focused Ion Beam Gases for Deposition and Enhanced Etch.- Three-Dimensional Nanofabrication Using Focused Ion Beams.- Device Edits and Modifications.- The Uses of Dual Beam FIB in Microelectronic Failure Analysis.- High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy.- FIB for Materials Science Applications-a Review.- Practical Aspects of FIB TEM Specimen Preparation.- FIB Lift-Out Specimen Preparation Techniques.- A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method.- Dual-Beam (FIB-SEM) Systems.- Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS).- Quantitative Three-Dimensional Analysis Using Focused Ion Beam Microscopy.- Applications of FIB in Combination with Auger Electron Spectroscopy.- Appendices. Index.

Details of the book - Introduction to Focused Ion Beams


EAN (ISBN-13): 9780387231167
ISBN (ISBN-10): 0387231161
Hardcover
Publishing year: 2005
Publisher: Springer-Verlag GmbH
358 Pages
Weight: 0,744 kg
Language: eng/Englisch

Book in our database since 05.04.2007 16:34:25
Book found last time on 23.06.2016 10:25:27
ISBN/EAN: 9780387231167

ISBN - alternate spelling:
0-387-23116-1, 978-0-387-23116-7

< to search results...
< to archive...
Related books