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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists - Joseph I. Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin
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Joseph I. Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori; Eric Lifshin:

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists - used book

1975, ISBN: 030640768X

ID: 4780200

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter- actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru- ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response biological sciences,biology,biology and life sciences,biotechnology,cell biology,developmental biology,earth sciences,electrical and electronics,electron microscopes and microscopy,engineering Biotechnology, Springer

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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists. - Goldstein, Joseph, Dale E. Newbury and Patrick Echlin
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Goldstein, Joseph, Dale E. Newbury and Patrick Echlin:

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists. - hardcover

1981, ISBN: 9780306407680

[PU: New York, Plenum Press], 673 p. Hardcover Ehemaliges Bibliotheksexemplar mit Signatur und Stempel. Guter Zustand. Book in good condition! 9780306407680, [SC: 5.00], gebraucht gut, gewerbliches Angebot, [GW: 1150g]

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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists - Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
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Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin:
Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists - used book

1981

ISBN: 030640768X

ID: 21133715918

[EAN: 9780306407680], Gebraucht, [PU: Springer], Science|Electron Microscopes & Microscopy, Science|Radiation, Shows definite wear, and perhaps considerable marking on inside.

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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists - Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin
book is out-of-stock
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Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin:
Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists - hardcover

1981, ISBN: 9780306407680

ID: 581837290

Springer, 1981-11-30. 1. Hardcover. Used:Good. Buy with confidence. Excellent Customer Service & Return policy. Ships Fast. 24*7 Customer Service., Springer, 1981-11-30

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Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists. - Goldstein, Joseph, Dale E. Newbury and Patrick Echlin
book is out-of-stock
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Goldstein, Joseph, Dale E. Newbury and Patrick Echlin:
Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists. - hardcover

1981, ISBN: 9780306407680

ID: 259986

673 p. Hardcover Ehemaliges Bibliotheksexemplar mit Signatur und Stempel. Guter Zustand. Book in good condition! 9780306407680 Versand D: 5,00 EUR, [PU:New York, Plenum Press,]

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Details of the book
Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
Author:

Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin

Title:

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists

ISBN:

9780306407680

Details of the book - Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists


EAN (ISBN-13): 9780306407680
ISBN (ISBN-10): 030640768X
Hardcover
Publishing year: 1981
Publisher: Springer

Book in our database since 25.10.2007 09:58:19
Book found last time on 30.01.2017 14:57:15
ISBN/EAN: 9780306407680

ISBN - alternate spelling:
0-306-40768-X, 978-0-306-40768-0

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