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X-Ray Scattering from Semiconductors - Paul F. Fewster
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Paul F. Fewster:

X-Ray Scattering from Semiconductors - hardcover

ISBN: 1860941591

[SR: 2499265], Gebundene Ausgabe, [EAN: 9781860941597], World Scientific Pub Co (, World Scientific Pub Co (, Book, [PU: World Scientific Pub Co (], World Scientific Pub Co (, 60537011, H… More...

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X-Ray Scattering from Semiconductors - Fewster, Paul F.
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X-Ray Scattering from Semiconductors - used book

ISBN: 9781860941597

X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback me… More...

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X-ray Scattering From Semiconductors - Paul F Fewster
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Paul F Fewster:
X-ray Scattering From Semiconductors - hardcover

2000

ISBN: 9781860941597

Buch, Hardcover, X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an esse… More...

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X-ray Scattering from Semiconductors - Fewster, Paul F
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Fewster, Paul F:
X-ray Scattering from Semiconductors - hardcover

2000, ISBN: 9781860941597

Imperial College Press, Hardcover, 304 Seiten, Publiziert: 2000-12-13T00:00:01Z, Produktgruppe: Book, 0.57 kg, Books Global Store, Special Features, Books, Physical Chemistry, Chemistry, … More...

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Fewster, Paul F:
X Ray Scattering From Semiconductors - hardcover

ISBN: 9781860941597

hardcover. Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book., 2.5

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X-ray Scattering From Semiconductors
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ISBN:

1860941591


X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc.This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors.

Details of the book - X-ray Scattering From Semiconductors


EAN (ISBN-13): 9781860941597
ISBN (ISBN-10): 1860941591
Hardcover
Publishing year: 2001
Publisher: Imperial College Press
287 Pages
Weight: 0,567 kg
Language: eng/Englisch

Book in our database since 2007-10-29T11:42:13-04:00 (New York)
Detail page last modified on 2023-06-06T12:55:11-04:00 (New York)
ISBN/EAN: 1860941591

ISBN - alternate spelling:
1-86094-159-1, 978-1-86094-159-7
Alternate spelling and related search-keywords:
Book title: ray scattering from semiconductors

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9781848160477 X-Ray Scattering From Semiconductors (Paul F. Fewster)

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