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X-Ray Scattering from Semiconductors - Fewster, Paul F.
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Fewster, Paul F.:
X-Ray Scattering from Semiconductors - hardcover

2001, ISBN: 1860941591, Lieferbar binnen 4-6 Wochen Shipping costs:Versandkostenfrei innerhalb der BRD

ID: 9781860941597

Internationaler Buchtitel. In englischer Sprache. Verlag: WORLD SCIENTIFIC PUB CO (, 287 Seiten, L=224mm, B=160mm, H=25mm, Gew.=567gr, [GR: 16460 - HC/Atomphysik/Kernphysik], [SW: - Technology & Industrial Arts], Gebunden, Klappentext: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc.<P>This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors. X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc.This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors.

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X-Ray Scattering from Semiconductors - Paul F. Fewster
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Paul F. Fewster:
X-Ray Scattering from Semiconductors - hardcover

ISBN: 1860941591

[SR: 2499265], Gebundene Ausgabe, [EAN: 9781860941597], World Scientific Pub Co (, World Scientific Pub Co (, Book, [PU: World Scientific Pub Co (], World Scientific Pub Co (, 60537011, Halbleiter, 60516011, Elektrotechnik, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 60556011, Materialwissenschaft, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56051011, Kristallografie, 56048011, Chemie, 56047011, Fachbücher, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56375011, Physik, 56376011, Akustik & Schall, 56427011, Angewandte Physik, 56429011, Astrophysik & Raumforschung, 56428011, Biophysik, 56270011, Chaos & Systeme, 56090011, Chemische Physik, 56378011, Dynamik, 56414011, Elektromagnetismus, 56383011, Energie, 56422011, Entropie, 56398011, Festkörperphysik, 56127011, Geophysik, 56404011, Kernphysik, 56377011, Kosmologie, 56386011, Licht, 56421011, Maschinenbau & Technik, 56272011, Mathematische Physik, 56389011, Mechanik, 56390011, Molekularphysik, 56391011, Nanostrukturen, 56392011, Optik, 56397011, Quantentheorie, 56393011, Relativität, 56385011, Schwerkraft, 1320310031, Statik, 56395011, Systemtheorie, 56396011, Wellen & Wellenmechanik, 56201011, Zeit, 56047011, Fachbücher, 54071011, Genres, 52044011, Fremdsprachige Bücher, 208622031, Gebundene Ausgabe, 208621031, Format (binding_browse-bin), 366250011, Refinements, 52044011, Fremdsprachige Bücher

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X-Ray Scattering from Semiconductors - Paul F. Fewster
book is out-of-stock
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Paul F. Fewster:
X-Ray Scattering from Semiconductors - hardcover

ISBN: 1860941591

[SR: 2499265], Gebundene Ausgabe, [EAN: 9781860941597], World Scientific Pub Co (, World Scientific Pub Co (, Book, [PU: World Scientific Pub Co (], World Scientific Pub Co (, 60537011, Halbleiter, 60516011, Elektrotechnik, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 60556011, Materialwissenschaft, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56051011, Kristallografie, 56048011, Chemie, 56047011, Fachbücher, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56375011, Physik, 56376011, Akustik & Schall, 56427011, Angewandte Physik, 56429011, Astrophysik & Raumforschung, 56428011, Biophysik, 56270011, Chaos & Systeme, 56090011, Chemische Physik, 56378011, Dynamik, 56414011, Elektromagnetismus, 56383011, Energie, 56422011, Entropie, 56398011, Festkörperphysik, 56127011, Geophysik, 56404011, Kernphysik, 56377011, Kosmologie, 56386011, Licht, 56421011, Maschinenbau & Technik, 56272011, Mathematische Physik, 56389011, Mechanik, 56390011, Molekularphysik, 56391011, Nanostrukturen, 56392011, Optik, 56397011, Quantentheorie, 56393011, Relativität, 56385011, Schwerkraft, 1320310031, Statik, 56395011, Systemtheorie, 56396011, Wellen & Wellenmechanik, 56201011, Zeit, 56047011, Fachbücher, 54071011, Genres, 52044011, Fremdsprachige Bücher, 208622031, Gebundene Ausgabe, 208621031, Format (binding_browse-bin), 366250011, Refinements, 52044011, Fremdsprachige Bücher

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X-Ray Scattering from Semiconductors - Fewster, Paul F.
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X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc. This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors. X-Ray Scattering from Semiconductors Fewster, Paul F., World Scientific Publishing Company

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X-Ray Scattering from Semiconductors - Fewster, Paul F.
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Fewster, Paul F.:
X-Ray Scattering from Semiconductors - hardcover

ISBN: 9781860941597

[ED: Hardcover], [PU: WORLD SCIENTIFIC PUB CO (], This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which is common to materials other than semiconductors.Versandfertig in über 4 Wochen, [SC: 0.00]

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Details of the book
X-Ray Scattering from Semiconductors

X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc.This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors.

Details of the book - X-Ray Scattering from Semiconductors


EAN (ISBN-13): 9781860941597
ISBN (ISBN-10): 1860941591
Hardcover
Publishing year: 2001
Publisher: WORLD SCIENTIFIC PUB CO (
287 Pages
Weight: 0,567 kg
Language: eng/Englisch

Book in our database since 29.10.2007 16:42:13
Book found last time on 07.04.2016 16:36:52
ISBN/EAN: 1860941591

ISBN - alternate spelling:
1-86094-159-1, 978-1-86094-159-7


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