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Pollino, Emiliano:

Microelectronic Reliability: Integrity Assessment and Assurance (Materials Science Library) - hardcover

1989, ISBN: 0890063508

[EAN: 9780890063507], Gebraucht, sehr guter Zustand, [SC: 3.5], [PU: Artech House Inc], INGENIEURWISSENSCHAFT & TECHNIK / NATURWISSENSCHAFTEN ELEKTROTECHNIK TECHNOLOGIE, 556 Seiten Gepfle… More...

NOT NEW BOOK. Shipping costs: EUR 3.50 getbooks GmbH, Bad Camberg, HE, Germany [55883480] [Rating: 5 (von 5)]
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Pollino, Emiliano:

Microelectronic Reliability: Integrity Assessment and Assurance (Materials Science Library) - hardcover

1989, ISBN: 0890063508

[EAN: 9780890063507], Gebraucht, sehr guter Zustand, [PU: Artech House Inc], INGENIEURWISSENSCHAFT & TECHNIK / NATURWISSENSCHAFTEN ELEKTROTECHNIK TECHNOLOGIE, 556 Seiten Gepflegtes ehemal… More...

NOT NEW BOOK. Shipping costs: EUR 3.50 getbooks GmbH, Bad Camberg, HE, Germany [55883480] [Rating: 5 (von 5)]
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Pollino, Emiliano:
Microelectronic Reliability: Integrity Assessment and Assurance (Materials Science Library) - hardcover

1989

ISBN: 0890063508

Gebundene Ausgabe 556 Seiten Gebundene Ausgabe Gepflegtes ehemaliges Bibliotheksexemplar mit den üblichen Kennzeichnungen (z.B. Barcode und Inventarisierungsnummer); in der Regel foliier… More...

Shipping costs:Sans frais d'envoi en Allemagne. (EUR 0.00) getbooks GmbH, 65510 Idstein
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Microelectronic Reliability: Integrity Assessment and Assurance - Pollino, Emiliano
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Pollino, Emiliano:
Microelectronic Reliability: Integrity Assessment and Assurance - used book

1989, ISBN: 9780890063507

Hardcover book. 556 pages. Published by Artech House Publishers (1989) Media > Book

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Microelectronic Reliability - Emiliano Pollino
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Emiliano Pollino:
Microelectronic Reliability - hardcover

1989, ISBN: 9780890063507

Buch, Hardcover, [PU: Artech House Publishers], Artech House Publishers, 1989

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Details of the book
Microelectronic Reliability
Author:
Title:
ISBN:

0890063508


A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi

Details of the book - Microelectronic Reliability


EAN (ISBN-13): 9780890063507
ISBN (ISBN-10): 0890063508
Hardcover
Paperback
Publishing year: 1989
Publisher: Artech House Publishers
556 Pages
Weight: 1,089 kg
Language: eng/Englisch

Book in our database since 2007-07-27T23:00:15-04:00 (New York)
Detail page last modified on 2024-01-03T20:19:04-05:00 (New York)
ISBN/EAN: 0890063508

ISBN - alternate spelling:
0-89006-350-8, 978-0-89006-350-7
Alternate spelling and related search-keywords:
Book title: microelectronic, reliability

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