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002: Microelectronic Reliability, Vol. 2: Integrity Assessment and Assurance (Artech House Materials Science Library) (English and Italian Edition) - Emiliano Pollino
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Emiliano Pollino:
002: Microelectronic Reliability, Vol. 2: Integrity Assessment and Assurance (Artech House Materials Science Library) (English and Italian Edition) - hardcover

ISBN: 0890063508

[SR: 7478539], Hardcover, [EAN: 9780890063507], Artech House Publishers, Artech House Publishers, Book, [PU: Artech House Publishers], Artech House Publishers, A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi, 13725, Semiconductors, 13707, Electronics, 227544, Electrical & Electronics, 173515, Engineering, 173507, Engineering & Transportation, 1000, Subjects, 283155, Books, 14631, Technology, 14637, History of Technology, 14639, Nanotechnology, 14644, Safety & Health, 271634011, Social Aspects, 75, Science & Math, 1000, Subjects, 283155, Books, 465600, New, Used & Rental Textbooks, 468220, Business & Finance, 468226, Communication & Journalism, 468204, Computer Science, 468224, Education, 468212, Engineering, 468206, Humanities, 468222, Law, 468228, Medicine & Health Sciences, 684283011, Reference, 468216, Science & Mathematics, 468214, Social Sciences, 684300011, Test Prep & Study Guides, 2349030011, Specialty Boutique, 283155, Books

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Microelectronic Reliability: Integrity Assessment and Assurance (Materials Science Library) - Pollino, Emiliano
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Pollino, Emiliano:
Microelectronic Reliability: Integrity Assessment and Assurance (Materials Science Library) - used book

1989, ISBN: 0890063508

ID: 12908936352

[EAN: 9780890063507], Gebraucht, sehr guter Zustand, [SC: 3.0], [PU: Artech House Inc,], HALBLEITER / NACHSCHLAGEWERKE, Technology|Electronics|General, Technology|Electronics|Microelectronics, Technology|Electronics|Semiconductors, Technology|General, 556 Seiten Gepflegtes ehemaliges Bibliotheksexemplar mit den üblichen Kennzeichnungen (z.B. Barcode und Inventarisierungsnummer); in der Regel foliiert (Umschlag aus selbstklebender Folie). Zustand unter Berücksichtigung des Alters gut. Tagesaktueller, sicherer und weltweiter Versand. Wir liefern grundsätzlich mit beiliegender Rechnung. 669737.01 Sprache: Englisch Gewicht in Gramm: 1089, Books

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Microelectronic Reliability: Integrity Assessment and Assurance (Materials Science Library) - Pollino, Emiliano
book is out-of-stock
(*)
Pollino, Emiliano:
Microelectronic Reliability: Integrity Assessment and Assurance (Materials Science Library) - hardcover

1989, ISBN: 0890063508

ID: 247806

Gebundene Ausgabe 556 Seiten Gebundene Ausgabe Gepflegtes ehemaliges Bibliotheksexemplar mit den üblichen Kennzeichnungen (z.B. Barcode und Inventarisierungsnummer); in der Regel foliiert (Umschlag aus selbstklebender Folie). Zustand unter Berücksichtigung des Alters gut. Tagesaktueller, sicherer und weltweiter Versand. Wir liefern grundsätzlich mit beiliegender Rechnung. 669737.01 Halbleiter / Nachschlagewerke gebraucht; gut, [PU:Artech House Inc,]

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Microelectronic Reliability: Integrity, Assessment and Assurance v. 2 - Emiliano Pollino
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Emiliano Pollino:
Microelectronic Reliability: Integrity, Assessment and Assurance v. 2 - hardcover

ISBN: 9780890063507

Hardback, [PU: Artech House Publishers], A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi, Electronics & Communications Engineering

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Microelectronic Reliability:  Integrity Assessment And Assurance - Emiliano Pollino
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Emiliano Pollino:
Microelectronic Reliability: Integrity Assessment And Assurance - new book

ISBN: 9780890063507

ID: 978089006350

Microelectronic Reliability: Integrity Assessment And Assurance Emiliano Pollino, Books, Microelectronic Reliability: Integrity Assessment And Assurance Books, Artech House Publishers

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Details of the book
Microelectronic Reliability: Integrity Assessment and Assurance

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi

Details of the book - Microelectronic Reliability: Integrity Assessment and Assurance


EAN (ISBN-13): 9780890063507
ISBN (ISBN-10): 0890063508
Hardcover
Publishing year: 1989
Publisher: ARTECH HOUSE INC
556 Pages
Weight: 1,089 kg
Language: eng/Englisch

Book in our database since 28.07.2007 05:00:15
Book found last time on 16.12.2017 11:16:53
ISBN/EAN: 0890063508

ISBN - alternate spelling:
0-89006-350-8, 978-0-89006-350-7


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