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Electrical Characterization of Silicon-on-Insulator Materials and Devices - Sorin Cristoloveanu, Sheng S. Li
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Sorin Cristoloveanu, Sheng S. Li:

Electrical Characterization of Silicon-on-Insulator Materials and Devices - new book

ISBN: 9780792395485

ID: 978079239548

Electrical Characterization of Silicon-on-Insulator Materials and Devices describes a wide variety of electrical characterization methods, from wafer screening and defect identification to detailed device evaluation. Each technique comes with pertinent technical information -- experimental set-up, basic models, parameter extraction -- that can be immediately useful to the reader. Electrical Characterization of Silicon-on-Insulator Materials and Devices provides a comprehensive and accessible treatment of all aspects of the latest SOI technologies, including material synthesis, device physics, characterization, circuit applications, and reliability issues. Both the academic researchers and engineers working on the SOI technology will find this book invaluable as a source of pertinent scientific information, practical details, and references. For people planning to enter the SOI field, this book offers a unique coverage of the SOI technology and an attractive presentation of the underlying concepts. This book may also be used as a graduate level textbook for students who wish to learn more about the physics, applications, and electrical characterization of SOI devices. Sorin Cristoloveanu, Sheng S. Li, Books, Science and Nature, Electrical Characterization of Silicon-on-Insulator Materials and Devices Books>Science and Nature, Springer

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Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science) - Sorin Cristoloveanu, Sheng Li
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Sorin Cristoloveanu, Sheng Li:

Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science) - hardcover

ISBN: 0792395484

Gebundene Ausgabe, [EAN: 9780792395485], Springer, Springer, Book, [PU: Springer], Springer, 60518011, Prinzip der Elektrizität, 60516011, Elektrotechnik, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 60537011, Halbleiter, 60516011, Elektrotechnik, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 60556011, Materialwissenschaft, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56441011, Technologie, 56447011, Erneuerbare Energien, 56448011, Innovationen, 1320311031, Nachschlagewerke, 56444011, Nanotechnologie, 56449011, Philosophie der Technologie, 56445011, Risiken, 56446011, Sicherheit & Gesundheit, 273011011, Soziale Aspekte, 54518011, Technisches Denken & Schreiben, 56451011, Technologie & Gesellschaft, 56211011, Technologiegeschichte, 56442011, Zukunftsforschung, 56047011, Wissenschaft, 54071011, Genres, 52044011, Fremdsprachige Bücher

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Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science) - Sorin Cristoloveanu, Sheng Li
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Sorin Cristoloveanu, Sheng Li:
Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science) - hardcover

ISBN: 0792395484

Gebundene Ausgabe, [EAN: 9780792395485], Springer, Springer, Book, [PU: Springer], Springer, 60518011, Prinzip der Elektrizität, 60516011, Elektrotechnik, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 60537011, Halbleiter, 60516011, Elektrotechnik, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 60556011, Materialwissenschaft, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56441011, Technologie, 56447011, Erneuerbare Energien, 56448011, Innovationen, 1320311031, Nachschlagewerke, 56444011, Nanotechnologie, 56449011, Philosophie der Technologie, 56445011, Risiken, 56446011, Sicherheit & Gesundheit, 273011011, Soziale Aspekte, 54518011, Technisches Denken & Schreiben, 56451011, Technologie & Gesellschaft, 56211011, Technologiegeschichte, 56442011, Zukunftsforschung, 56047011, Wissenschaft, 54071011, Genres, 52044011, Fremdsprachige Bücher

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Electrical Characterization of Silicon-on-Insulator Materials and Devices - Sorin Cristoloveanu; Sheng Li
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Electrical Characterization of Silicon-on-Insulator Materials and Devices - new book

ISBN: 9780792395485

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Engineering; Electrical Engineering; Optical and Electronic Materials Diode, electronics, material, microelectronics, transistor, Wafer Books Book, Springer Science+Business Media

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Electrical Characterization of Silicon-on-Insulator Materials and Devices - Sheng Li  Sorin Cristoloveanu
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Electrical Characterization of Silicon-on-Insulator Materials and Devices - new book

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NA Devices, Electrical, Springer

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Details of the book
Electrical Characterization of Silicon-on-Insulator Materials and Devices
Author:

Cristoloveanu, Sorin; Li, Sheng S.; Li Sheng S.

Title:

Electrical Characterization of Silicon-on-Insulator Materials and Devices

ISBN:

0792395484

Electrical Characterization of Silicon-on-Insulator Materials and Devices describes a wide variety of electrical characterization methods, from wafer screening and defect identification to detailed device evaluation. Each technique comes with pertinent technical information -- experimental set-up, basic models, parameter extraction -- that can be immediately useful to the reader. Electrical Characterization of Silicon-on-Insulator Materials and Devices provides a comprehensive and accessible treatment of all aspects of the latest SOI technologies, including material synthesis, device physics, characterization, circuit applications, and reliability issues. Both the academic researchers and engineers working on the SOI technology will find this book invaluable as a source of pertinent scientific information, practical details, and references. For people planning to enter the SOI field, this book offers a unique coverage of the SOI technology and an attractive presentation of the underlying concepts. This book may also be used as a graduate level textbook for students who wish to learn more about the physics, applications, and electrical characterization of SOI devices.

Details of the book - Electrical Characterization of Silicon-on-Insulator Materials and Devices


EAN (ISBN-13): 9780792395485
ISBN (ISBN-10): 0792395484
Hardcover
Publishing year: 1995
Publisher: Springer-Verlag GmbH
400 Pages
Weight: 0,760 kg

Book in our database since 18.11.2007 04:22:02
Book found last time on 09.02.2017 08:00:22
ISBN/EAN: 0792395484

ISBN - alternate spelling:
0-7923-9548-4, 978-0-7923-9548-5

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