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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - hardcover

2004, ISBN: 9780387231167

Editor: Giannuzzi, Lucille A. Editor: North Carolina State University Center for the Biology of, Springer, Hardcover, Auflage: 2005, 374 Seiten, Publiziert: 2004-11-19T00:00:01Z, Produktg… More...

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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - hardcover

2004, ISBN: 9780387231167

Springer, Gebundene Ausgabe, Auflage: 2005, 374 Seiten, Publiziert: 2004-11-19T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: 13743395, 3.44 kg, Verkaufsrang: 4915, Maschinenbau, Ingenie… More...

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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - hardcover

2004

ISBN: 9780387231167

Springer, Gebundene Ausgabe, Auflage: 2005, 374 Seiten, Publiziert: 2004-11-19T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: 13743395, 3.44 kg, Verkaufsrang: 4915, Maschinenbau, Ingenie… More...

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Introduction to Focused Ion Beams - Lucille A. Giannuzzi; North Carolina State University
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Lucille A. Giannuzzi; North Carolina State University:
Introduction to Focused Ion Beams - hardcover

2004, ISBN: 9780387231167

Instrumentation, Theory, Techniques and Practice, Buch, Hardcover, 2005 ed. Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that dis… More...

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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - hardcover

2004, ISBN: 0387231161

[EAN: 9780387231167], Used, good, [PU: Springer], Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have so… More...

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Introduction to Focused Ion Beams
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ISBN:

0387231161


Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. TOC:The Focused Ion Beam Instrument.- Ion-Solid Interactions.- Focused Ion Beam Gases for Deposition and Enhanced Etch.- Three-Dimensional Nanofabrication Using Focused Ion Beams.- Device Edits and Modifications.- The Uses of Dual Beam FIB in Microelectronic Failure Analysis.- High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy.- FIB for Materials Science Applications-a Review.- Practical Aspects of FIB TEM Specimen Preparation.- FIB Lift-Out Specimen Preparation Techniques.- A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method.- Dual-Beam (FIB-SEM) Systems.- Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS).- Quantitative Three-Dimensional Analysis Using Focused Ion Beam Microscopy.- Applications of FIB in Combination with Auger Electron Spectroscopy.- Appendices. Index.

Details of the book - Introduction to Focused Ion Beams


EAN (ISBN-13): 9780387231167
ISBN (ISBN-10): 0387231161
Hardcover
Paperback
Publishing year: 2005
Publisher: Springer-Verlag New York Inc.
358 Pages
Weight: 0,744 kg
Language: eng/Englisch

Book in our database since 2007-04-05T10:34:25-04:00 (New York)
Detail page last modified on 2023-07-21T23:45:59-04:00 (New York)
ISBN/EAN: 0387231161

ISBN - alternate spelling:
0-387-23116-1, 978-0-387-23116-7
Alternate spelling and related search-keywords:
Book author: isaac asimov
Book title: instrumentation, introduction focused ion beams, focus 2008, theory beams, beam theory, focused seven

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