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Transmission Electron Microscopy. A Textbook for Materials Science.  Bd. I - IV - David B. Williams, C. Barry Carter
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Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV - Paperback

ISBN: 030645324X

[SR: 477277], Taschenbuch, [EAN: 9780306453243], Springer, Springer, Book, [PU: Springer], Springer, 403432, Schule & Lernen, 405500, Allgemeinbildung, 14025941, Berufs- & Fachschulbücher… More...

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Transmission Electron Microscopy. A Textbook for Materials Science.  Bd. I - IV - David B. Williams, C. Barry Carter
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David B. Williams, C. Barry Carter:

Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV - Paperback

ISBN: 030645324X

[SR: 477277], Taschenbuch, [EAN: 9780306453243], Springer, Springer, Book, [PU: Springer], Springer, 403432, Schule & Lernen, 405500, Allgemeinbildung, 14025941, Berufs- & Fachschulbücher… More...

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3
Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) - David B. Williams, C. Barry Carter
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David B. Williams, C. Barry Carter:
Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) - Paperback

ISBN: 9780306453243

by Williams, David B.; Carter, C.... | PB | Acceptable, Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) by Williams, David B.; Carter, C. Barry Readable cop… More...

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Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) - David B. Williams
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David B. Williams:
Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) - Paperback

2004, ISBN: 030645324X

[EAN: 9780306453243], Used, very good, [PU: Springer], Books

NOT NEW BOOK. Shipping costs: EUR 4.75 Denver Deep Reads, Denver, CO, U.S.A. [83643802] [Rating: 5 (of 5)]
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Transmission Electron Microscopy - Carter C. Barry Williams David B.
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Carter C. Barry Williams David B.:
Transmission Electron Microscopy - Paperback

2004, ISBN: 030645324X

[EAN: 9780306453243], [PU: Springer], pp. 703, Books

Shipping costs: EUR 8.25 Majestic Books, Hounslow, United Kingdom [51749587] [Rating: 4 (of 5)]

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Bibliographic data of the best matching book

Details of the book
Transmission Electron Microscopy. A Textbook for Materials Science.  Bd. I - IV

This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Details of the book - Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV


EAN (ISBN-13): 9780306453243
ISBN (ISBN-10): 030645324X
Paperback
Publishing year: 1996
Publisher: Springer
703 Pages
Weight: 1,964 kg
Language: eng/Englisch

Book in our database since 2007-04-23T19:18:06-04:00 (New York)
Detail page last modified on 2023-07-04T03:15:08-04:00 (New York)
ISBN/EAN: 030645324X

ISBN - alternate spelling:
0-306-45324-X, 978-0-306-45324-3
Alternate spelling and related search-keywords:
Book author: david carter, carter william, carter barry, williams and carter
Book title: transmission electron microscopy textbook for materials science


Information from Publisher

Author: David B. Williams; C. Barry Carter
Title: Transmission Electron Microscopy - A Textbook for Materials Science
Publisher: Springer; Springer US
729 Pages
Publishing year: 2004-08-31
New York; NY; US
Printed / Made in
Weight: 1,840 kg
Language: English
85,59 € (DE)
87,99 € (AT)
106,60 CHF (CH)
Not available, publisher indicates OP

BC; Book; Hardcover, Softcover / Physik, Astronomie/Mechanik, Akustik; Spektroskopie, Spektrochemie, Massenspektrometrie; electron microscope; electron microscopy; diffraction; crystal; microscopy; transmission electron microscopy; Helium-Atom-Streuung; materials characterization; B; Physics and Astronomy; Spectroscopy and Microscopy; Surface and Interface Science, Thin Films; Solid State Physics; Characterization and Evaluation of Materials; Biological Microscopy; Wissenschaftliche Ausstattung, Experimente und Techniken; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Spektroskopie, Spektrochemie, Massenspektrometrie; Werkstoffprüfung; Biologie, Biowissenschaften; Wissenschaftliche Ausstattung, Experimente und Techniken; BB; BC

Basics: 1. The Transmission Electron Microscope. 2. Scattering and Diffraction. 3. Elastic Scattering. 4. Inelastic Scattering and Beam Damage. 5. Electron Sources. 6. Lenses, Apertures, and Resolution 7. How to `See' Electrons. 8. Pumps and Holders. 9. The Instrument 10. Specimen Preparation. Diffraction: 11. Diffraction Patterns. 12. Thinking in Reciprocal Space 13. Diffracted Beams. 14. Bloch Waves. 15. Dispersion Surfaces. 16. Diffraction from Crystals. 17. Diffraction from Small Volumes. 18. Indexing Diffraction Patterns. 19. Kikuchi Diffraction. 20. Obtaining CBED Patterns. 21. Using Covergent-Beam Technologies. Imaging: 22. Imaging in the TEM. 23. Thickness and Bending Effects. 24. Planar Defects. 25. Strain Fields. 26. WeakBeam Dark-Field Microscopy. 27. Phase-Contrast Images. 28. High-Resolution TEM. 29. Image Simulation. 30. Quantifying and Processing HRTEM Images. 31. Other Imaging Techniques. Spectrometry: 32. Xray Spectrometry. 33. The XEDS-TEM Interface. 34. Qualitative Xray Analysis. 35. Quantitative Xray Microanalysis. 36. Spatial Resolution and Minimum Detectability. 37. Electron EnergyLoss Spectrometers. 38. The EnergyLoss Spectrum. 39. Microanalysis with Ionization-Loss Electrons. 40. Everything Else in the Spectrum. Index.

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