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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - hardcover

2004, ISBN: 9780387231167

Editor: Giannuzzi, Lucille A. Editor: North Carolina State University Center for the Biology of, Springer, Hardcover, Auflage: 2005, 374 Seiten, Publiziert: 2004-11-19T00:00:01Z, Produktg… More...

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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - hardcover

2004, ISBN: 9780387231167

Springer, Gebundene Ausgabe, Auflage: 2005, 374 Seiten, Publiziert: 2004-11-19T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: 13743395, 3.44 kg, Verkaufsrang: 4915, Maschinenbau, Ingenie… More...

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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - hardcover

2004

ISBN: 9780387231167

Springer, Gebundene Ausgabe, Auflage: 2005, 374 Seiten, Publiziert: 2004-11-19T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: 13743395, 3.44 kg, Verkaufsrang: 4915, Maschinenbau, Ingenie… More...

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Introduction to Focused Ion Beams - Lucille A. Giannuzzi; North Carolina State University
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Lucille A. Giannuzzi; North Carolina State University:
Introduction to Focused Ion Beams - hardcover

2004, ISBN: 9780387231167

Instrumentation, Theory, Techniques and Practice, Buch, Hardcover, 2005 ed. Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that dis… More...

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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
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Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice - hardcover

2004, ISBN: 0387231161

[EAN: 9780387231167], Used, good, [PU: Springer], Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have so… More...

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Details of the book
Introduction to Focused Ion Beams

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. TOC:The Focused Ion Beam Instrument.- Ion-Solid Interactions.- Focused Ion Beam Gases for Deposition and Enhanced Etch.- Three-Dimensional Nanofabrication Using Focused Ion Beams.- Device Edits and Modifications.- The Uses of Dual Beam FIB in Microelectronic Failure Analysis.- High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy.- FIB for Materials Science Applications-a Review.- Practical Aspects of FIB TEM Specimen Preparation.- FIB Lift-Out Specimen Preparation Techniques.- A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method.- Dual-Beam (FIB-SEM) Systems.- Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS).- Quantitative Three-Dimensional Analysis Using Focused Ion Beam Microscopy.- Applications of FIB in Combination with Auger Electron Spectroscopy.- Appendices. Index.

Details of the book - Introduction to Focused Ion Beams


EAN (ISBN-13): 9780387231167
ISBN (ISBN-10): 0387231161
Hardcover
Paperback
Publishing year: 2005
Publisher: Springer-Verlag New York Inc.
358 Pages
Weight: 0,744 kg
Language: eng/Englisch

Book in our database since 2007-04-05T10:34:25-04:00 (New York)
Detail page last modified on 2023-07-21T23:45:59-04:00 (New York)
ISBN/EAN: 0387231161

ISBN - alternate spelling:
0-387-23116-1, 978-0-387-23116-7
Alternate spelling and related search-keywords:
Book author: isaac asimov
Book title: instrumentation, introduction focused ion beams, focus 2008, theory beams, beam theory, focused seven


Information from Publisher

Author: Lucille A. Giannuzzi
Title: Introduction to Focused Ion Beams - Instrumentation, Theory, Techniques and Practice
Publisher: Springer; Springer US
357 Pages
Publishing year: 2004-11-19
New York; NY; US
Language: English
192,59 € (DE)
197,99 € (AT)
212,50 CHF (CH)
Available
XVII, 357 p. 34 illus., 28 illus. in color.

BB; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; SIMS; instruments; material; microscopy; spectroscopy; Condensed Matter Physics; Surfaces, Interfaces and Thin Film; Optical Materials; Spectroscopy; Materialwissenschaft; Technische Anwendung von elektronischen, magnetischen, optischen Materialien; Spektroskopie, Spektrochemie, Massenspektrometrie; EA; BC

The focused ion beam (FIB) instrument has experienced an intensive period of maturation since its inception. Numerous new techniques and applications have been brought to fruition, and over the past few years, the FIB has gained acceptance as more than just an expensive sample preparation tool. It has taken its place among the suite of other instruments commonly available in analytical and forensic laboratories, universities, geological, medical and biological research institutions, and manufacturing plants. Although the utility of the FIB is not limited to the preparation of specimens for subsequent analysis by other analytical techniques, it has revolutionized the area of TEM specimen preparation. The FIB has also been used to prepare samples for numerous other analytical techniques, and offers a wide range of other capabilities. While the mainstream of FIB usage remains within the semiconductor industry, FIB usage has expanded to applications in metallurgy, ceramics, composites, polymers, geology, art, biology, pharmaceuticals, forensics, and other disciplines. Computer automated procedures have been configured for unattended use of FIB and dual platform instruments. New applications of FIB and dual platform instrumentation are constantly being developed for materials characterization and nanotechnology. The site specific nature of the FIB milling and deposition capabilities allows preparation and processing of materials in ways that are limited only by one's imagination. Introduction to Focused Ion Beams is geared towards techniques and applications. The first portion of this book introduces the basics of FIB instrumentation, milling, and deposition capabilities. The chapter dedicated to ion-solid interactions is presented so that the FIB user can understand which parameters will influence FIB milling behavior. The remainder of the book focuses on how to prepare and analyze samples using FIB and related tools, and presents specific applications and techniques of the uses of FIB milling, deposition, and dual platform techniques. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and Dual platform instruments.
Only text that discusses and presents the theory directly related to applications and the only one that disscusses the vast applications and techniques used in FIBs and dual platform instruments Includes supplementary material: sn.pub/extras

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