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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz & James M. Howe
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Brent Fultz & James M. Howe:

Transmission Electron Microscopy and Diffractometry of Materials - new book

ISBN: 9783642297618

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… More...

Nr. A1031608643. Shipping costs:Lieferzeiten außerhalb der Schweiz 3 bis 21 Werktage, , Sofort per Download lieferbar, zzgl. Versandkosten. (EUR 17.75)
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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz#James M. Howe
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Brent Fultz#James M. Howe:

Transmission Electron Microscopy and Diffractometry of Materials - new book

2012, ISBN: 9783642297618

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… More...

Nr. 33784366. Shipping costs:, Sofort per Download lieferbar, DE. (EUR 0.00)
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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James Howe
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Brent Fultz; James Howe:
Transmission Electron Microscopy and Diffractometry of Materials - new book

ISBN: 9783642297618

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… More...

new in stock. Shipping costs:zzgl. Versandkosten. (EUR 0.00)
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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James Howe
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Brent Fultz; James Howe:
Transmission Electron Microscopy and Diffractometry of Materials - new book

2013, ISBN: 9783642297618

eBooks, eBook Download (PDF), Auflage, [PU: Springer Lehrbuch], [ED: 4], Springer Lehrbuch, 2013

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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James M. Howe
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Brent Fultz; James M. Howe:
Transmission Electron Microscopy and Diffractometry of Materials - new book

2013, ISBN: 9783642297618

eBooks, eBook Download (PDF), 4th ed. 2013, [PU: Springer Berlin], Springer Berlin, 2013

Shipping costs:Download sofort lieferbar. (EUR 0.00)

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Details of the book - Transmission Electron Microscopy and Diffractometry of Materials


EAN (ISBN-13): 9783642297618
ISBN (ISBN-10): 3642297617
Publishing year: 2012
Publisher: Springer Lehrbuch
761 Pages
Language: eng/Englisch

Book in our database since 2012-11-07T02:35:01-05:00 (New York)
Detail page last modified on 2023-01-10T17:14:26-05:00 (New York)
ISBN/EAN: 9783642297618

ISBN - alternate spelling:
3-642-29761-7, 978-3-642-29761-8
Alternate spelling and related search-keywords:
Book author: james, howe, jam, brent, fultz
Book title: electron microscopy materials, material, electro, transmission


Information from Publisher

Author: Brent Fultz; James Howe
Title: Graduate Texts in Physics; Transmission Electron Microscopy and Diffractometry of Materials
Publisher: Springer; Springer Berlin
764 Pages
Publishing year: 2012-10-13
Berlin; Heidelberg; DE
Language: English
90,94 € (DE)
93,50 € (AT)
100,50 CHF (CH)
Available
XX, 764 p.

EA; E107; eBook; Nonbooks, PBS / Chemie/Physikalische Chemie; Spektroskopie, Spektrochemie, Massenspektrometrie; Verstehen; Characterization of Materials; Dark-Field and Bright-Field Imaging; Diffraction and Imaging; Diffraction from Crystals; Imaging Lens Systems; Neutron Scattering; Small-Angle Scattering; Theory of Electron Microscopy and X-Ray Diffraction; Transmission Electron Microscopy; X-Ray Diffractometry; B; Spectroscopy; Characterization and Analytical Technique; Surfaces, Interfaces and Thin Film; Surface and Interface and Thin Film; Physics and Astronomy; Werkstoffprüfung; Materialwissenschaft; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); BC

Diffraction and X-Ray Powder Diffractometer Problems.- TEM and its Optics Problems.- Neutron Scattering Problems.- Scattering Problems.- Inelastic Electron Scattering and Spectroscopy Problems.- Diffraction from Crystals Sphere Problems.- Electron Diffraction and Crystallography Problems.- Diffraction Contrast in TEM Images Problems.- Diffraction Lineshapes Problems.- Patterson Functions and Diffuse Scattering Problems.- High-Resolution TEM Imaging Problems.- High-Resolution STEM and Related Imaging Techniques Problems.- Dynamical Theory Problems.

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on  Transmission Electron Microscopy and Diffractometry of Materials.

 

James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.


New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching with numerous problems at the end of each chapter to give students practice with the concepts and practical applications Explains the mathematics needed consistently through the book Helps to extend knowledge by indicating further reading Explains concepts in detail, with no requirement for different reference materials Includes supplementary material: sn.pub/extras

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