ISBN: 9781441909305
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… More...
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Analysis and Design of Resilient VLSI Circuits / Mitigating Soft Errors and Process Variations / Rajesh Garg / Buch / XXII / Englisch / 2009 / Springer US / EAN 9781441909305 - hardcover
2009, ISBN: 9781441909305
[ED: Gebunden], [PU: Springer US], This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated ci… More...
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ISBN: 9781441909305
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… More...
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Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations 2010 - First edition
2009, ISBN: 9781441909305
2010 Neubindung, Buchschnitt leicht verkürzt, 1. Auflage 2010 5590093/12 Versandkostenfreie Lieferung Crosstalk,modeling,Soft Errors,VLSI,design automation,algorithms,stability,EDA,circui… More...
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Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations - First edition
2009, ISBN: 9781441909305
[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, 1. Auflage 2010 5590093/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, PayPal, Klarna-Sofortüberweisung, … More...
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Analysis and Design of Resilient VLSI Circuits by Rajesh Garg Hardcover | Indigo Chapters - new book
ISBN: 9781441909305
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… More...
Garg, Rajesh:
Analysis and Design of Resilient VLSI Circuits / Mitigating Soft Errors and Process Variations / Rajesh Garg / Buch / XXII / Englisch / 2009 / Springer US / EAN 9781441909305 - hardcover2009, ISBN: 9781441909305
[ED: Gebunden], [PU: Springer US], This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated ci… More...
ISBN: 9781441909305
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingl… More...
Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations 2010 - First edition
2009, ISBN: 9781441909305
2010 Neubindung, Buchschnitt leicht verkürzt, 1. Auflage 2010 5590093/12 Versandkostenfreie Lieferung Crosstalk,modeling,Soft Errors,VLSI,design automation,algorithms,stability,EDA,circui… More...
Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations - First edition
2009, ISBN: 9781441909305
[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, 1. Auflage 2010 5590093/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, PayPal, Klarna-Sofortüberweisung, … More...
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Details of the book - Analysis and Design of Resilient VLSI Circuits by Rajesh Garg Hardcover | Indigo Chapters
EAN (ISBN-13): 9781441909305
ISBN (ISBN-10): 1441909303
Hardcover
Publishing year: 2009
Publisher: Rajesh Garg
212 Pages
Weight: 0,501 kg
Language: eng/Englisch
Book in our database since 2009-12-07T15:28:53-05:00 (New York)
Detail page last modified on 2024-02-11T16:40:49-05:00 (New York)
ISBN/EAN: 1441909303
ISBN - alternate spelling:
1-4419-0930-3, 978-1-4419-0930-5
Alternate spelling and related search-keywords:
Book author: sunil, garg
Book title: circuits, error design, vlsi, design and analysis, circuit analysis, garg, process design
Information from Publisher
Author: Rajesh Garg
Title: Analysis and Design of Resilient VLSI Circuits - Mitigating Soft Errors and Process Variations
Publisher: Springer; Springer US
212 Pages
Publishing year: 2009-11-16
New York; NY; US
Printed / Made in
Language: English
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXII, 212 p.
BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Crosstalk; EDA; Power Supply Variation; Radiation Effects; Resilient VLSI Design; Soft Errors; VLSI; VLSI Design; algorithms; circuit design; design automation; electronic design automation; modeling; simulation; stability; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Computer-Aided Design (CAD); EA; BC
This book is motivated by the challenges faced in designing reliable integratedsystems using modern VLSI processes. The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in the deep sub-micron (DSM) era. With continuously decreasing device feature sizes, combined with lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations and radiation-induced soft errors.This book describes the design of resilient VLSI circuits. It presents algorithms to analyze the detrimental effects of radiation particle strikes and processing variations on the electrical behavior of VLSI circuits, as well as circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerant circuit design and process variation tolerant circuit design; Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems; Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers.Describes the state of the art in the areas of radiation tolerance circuit design and process variation tolerant circuit design Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers Includes supplementary material: sn.pub/extras
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