2001, ISBN: 9781441909275
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… More...
booklooker.de |
Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - hardcover
2009, ISBN: 9781441909275
[ED: Gebunden], [PU: Springer US], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate … More...
booklooker.de |
2009, ISBN: 9781441909275
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such a… More...
Thalia.de Nr. 17593546. Shipping costs:, Sofort lieferbar, DE. (EUR 0.00) Details... |
2001, ISBN: 9781441909275
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… More...
booklooker.de |
2009, ISBN: 9781441909275
[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, Buchrücken leicht geknickt, 1. Auflage 2010 5664520/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, Banküb… More...
booklooker.de |
2001, ISBN: 9781441909275
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… More...
Girard, Patrick:
Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - hardcover2009, ISBN: 9781441909275
[ED: Gebunden], [PU: Springer US], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate … More...
2009
ISBN: 9781441909275
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such a… More...
2001, ISBN: 9781441909275
[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… More...
2009, ISBN: 9781441909275
[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, Buchrücken leicht geknickt, 1. Auflage 2010 5664520/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, Banküb… More...
Bibliographic data of the best matching book
Author: | |
Title: | |
ISBN: |
Details of the book - Power-Aware Testing and Test Strategies for Low Power Devices
EAN (ISBN-13): 9781441909275
ISBN (ISBN-10): 1441909273
Hardcover
Publishing year: 2009
Publisher: Springer-Verlag New York Inc.
363 Pages
Weight: 0,717 kg
Language: eng/Englisch
Book in our database since 2009-11-13T14:04:16-05:00 (New York)
Detail page last modified on 2023-11-10T11:15:21-05:00 (New York)
ISBN/EAN: 1441909273
ISBN - alternate spelling:
1-4419-0927-3, 978-1-4419-0927-5
Alternate spelling and related search-keywords:
Book author: girard patrick, xiaoqi
Book title: test, the power now
Information from Publisher
Author: Patrick Girard; Nicola Nicolici; Xiaoqing Wen
Title: Power-Aware Testing and Test Strategies for Low Power Devices
Publisher: Springer; Springer US
363 Pages
Publishing year: 2009-11-23
New York; NY; US
Printed / Made in
Language: English
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXI, 363 p.
BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Electronic Testing; Low Power Design; Low Power Testing; Nanoscale Testing; Nicolici; Power Aware Testing; Semiconductor Testing; VLSI; Wen; power management; semiconductor; testing; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Computer-Aided Design (CAD); EA; BC
Fundamentals of VLSI Testing.- Power Issues During Test.- Low-Power Test Pattern Generation.- Power-Aware Design-for-Test.- Power-Aware Test Data Compression and BIST.- Power-Aware System-Level Test Planning.- Low-Power Design Techniques and Test Implications.- Test Strategies for Multivoltage Designs.- Test Strategies for Gated Clock Designs.- Test of Power Management Structures.- EDA Solution for Power-Aware Design-for-Test.Is the only comprehensive book on power-aware test for (low power) circuits and systems Instructs readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design for test and low-power design Incorporates detailed coverage of all levels of abstraction for power-aware testing of (low-power) circuits and systems Presents state-of-the-art industrial practices and EDA solutions Includes supplementary material: sn.pub/extras
More/other books that might be very similar to this book
Latest similar book:
9781489983138 Power-Aware Testing and Test Strategies for Low Power Devices (Herausgegeben:Nicolici, Nicola Wen, Xiaoqing Girard, Patrick)
- 9781489983138 Power-Aware Testing and Test Strategies for Low Power Devices (Herausgegeben:Nicolici, Nicola Wen, Xiaoqing Girard, Patrick)
- 9781441909299 Power-Aware Testing and Test Strategies for Low Power Devices
- 9781441909282 Power-Aware Testing and Test Strategies for Low Power Devices (Patrick Girard; Nicola Nicolici; Xiaoqing Wen)
< to archive...