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1
Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard
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Patrick Girard:

Power-Aware Testing and Test Strategies for Low Power Devices - new book

2001, ISBN: 9781441909275

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… More...

Shipping costs:Envío gratis. (EUR 0.00) Buchhandlung Kühn GmbH
2
Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - Girard, Patrick
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Girard, Patrick:

Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - hardcover

2009, ISBN: 9781441909275

[ED: Gebunden], [PU: Springer US], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate … More...

Shipping costs:Envío gratis. (EUR 0.00) Buchbär
3
Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard#Nicola Nicolici#Xiaoqing Wen
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Patrick Girard#Nicola Nicolici#Xiaoqing Wen:
Power-Aware Testing and Test Strategies for Low Power Devices - hardcover

2009

ISBN: 9781441909275

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such a… More...

Nr. 17593546. Shipping costs:, Sofort lieferbar, DE. (EUR 0.00)
4
Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard
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€ 163.83
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Patrick Girard:
Power-Aware Testing and Test Strategies for Low Power Devices - new book

2001, ISBN: 9781441909275

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… More...

Shipping costs:Envío gratis. (EUR 0.00) buchversandmimpf2000
5
Power-Aware Testing and Test Strategies for Low Power Devices - Girard, Patrick, Nicola Nicolici  und Xiaoqing Wen
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Girard, Patrick, Nicola Nicolici und Xiaoqing Wen:
Power-Aware Testing and Test Strategies for Low Power Devices - First edition

2009, ISBN: 9781441909275

[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, Buchrücken leicht geknickt, 1. Auflage 2010 5664520/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, Banküb… More...

Shipping costs:Versandkostenfrei, Versand nach Deutschland. (EUR 0.00) Buchpark GmbH

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Details of the book
Power-Aware Testing and Test Strategies for Low Power Devices

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Details of the book - Power-Aware Testing and Test Strategies for Low Power Devices


EAN (ISBN-13): 9781441909275
ISBN (ISBN-10): 1441909273
Hardcover
Publishing year: 2009
Publisher: Springer-Verlag New York Inc.
363 Pages
Weight: 0,717 kg
Language: eng/Englisch

Book in our database since 2009-11-13T14:04:16-05:00 (New York)
Detail page last modified on 2023-11-10T11:15:21-05:00 (New York)
ISBN/EAN: 1441909273

ISBN - alternate spelling:
1-4419-0927-3, 978-1-4419-0927-5
Alternate spelling and related search-keywords:
Book author: girard patrick, xiaoqi
Book title: test, the power now


Information from Publisher

Author: Patrick Girard; Nicola Nicolici; Xiaoqing Wen
Title: Power-Aware Testing and Test Strategies for Low Power Devices
Publisher: Springer; Springer US
363 Pages
Publishing year: 2009-11-23
New York; NY; US
Printed / Made in
Language: English
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXI, 363 p.

BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Electronic Testing; Low Power Design; Low Power Testing; Nanoscale Testing; Nicolici; Power Aware Testing; Semiconductor Testing; VLSI; Wen; power management; semiconductor; testing; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Computer-Aided Design (CAD); EA; BC

Fundamentals of VLSI Testing.- Power Issues During Test.- Low-Power Test Pattern Generation.- Power-Aware Design-for-Test.- Power-Aware Test Data Compression and BIST.- Power-Aware System-Level Test Planning.- Low-Power Design Techniques and Test Implications.- Test Strategies for Multivoltage Designs.- Test Strategies for Gated Clock Designs.- Test of Power Management Structures.- EDA Solution for Power-Aware Design-for-Test.
Is the only comprehensive book on power-aware test for (low power) circuits and systems Instructs readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design for test and low-power design Incorporates detailed coverage of all levels of abstraction for power-aware testing of (low-power) circuits and systems Presents state-of-the-art industrial practices and EDA solutions Includes supplementary material: sn.pub/extras

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