ISBN: 9780792395058
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with… More...
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ISBN: 9780792395058
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious wi… More...
Indigo.ca new in stock. Shipping costs:zzgl. Versandkosten., plus shipping costs Details... |
ISBN: 9780792395058
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with… More...
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ISBN: 0792395050
Modeling of Electrical Overstress in Integrated Circuits ab 181.99 € als gebundene Ausgabe: Auflage 1995. Aus dem Bereich: Bücher, Wissenschaft, Technik, Medien > Bücher, Springer US
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1994, ISBN: 0792395050
1995 Gebundene Ausgabe Elektrotechnik, VLSI; Development; integratedcircuit; Material; Semiconductor; semiconductordevices; Simulation; tables; testing, mit Schutzumschlag 11, [PU:Sprin… More...
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Modeling of Electrical Overstress in Integrated Circuits by Carlos H. Diaz Hardcover | Indigo Chapters - new book
ISBN: 9780792395058
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with… More...
ISBN: 9780792395058
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious wi… More...
ISBN: 9780792395058
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with… More...
ISBN: 0792395050
Modeling of Electrical Overstress in Integrated Circuits ab 181.99 € als gebundene Ausgabe: Auflage 1995. Aus dem Bereich: Bücher, Wissenschaft, Technik, Medien > Bücher, Springer US
1994, ISBN: 0792395050
1995 Gebundene Ausgabe Elektrotechnik, VLSI; Development; integratedcircuit; Material; Semiconductor; semiconductordevices; Simulation; tables; testing, mit Schutzumschlag 11, [PU:Sprin… More...
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Details of the book - Modeling of Electrical Overstress in Integrated Circuits by Carlos H. Diaz Hardcover | Indigo Chapters
EAN (ISBN-13): 9780792395058
ISBN (ISBN-10): 0792395050
Hardcover
Publishing year: 1994
Publisher: Carlos H. Diaz
178 Pages
Weight: 0,438 kg
Language: eng/Englisch
Book in our database since 2007-11-06T12:07:32-05:00 (New York)
Detail page last modified on 2023-09-27T07:01:24-04:00 (New York)
ISBN/EAN: 0792395050
ISBN - alternate spelling:
0-7923-9505-0, 978-0-7923-9505-8
Alternate spelling and related search-keywords:
Book author: carlos, diaz diaz, kim sung, kang
Book title: modeling electrical overstress integrated circuits, integrated science, springer
Information from Publisher
Author: Carlos H. Diaz; Sung-Mo (Steve) Kang; Charvaka Duvvury
Title: The Springer International Series in Engineering and Computer Science; Modeling of Electrical Overstress in Integrated Circuits
Publisher: Springer; Springer US
148 Pages
Publishing year: 1994-11-30
New York; NY; US
Language: English
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
Available
XXV, 148 p.
BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; VLSI; development; integrated circuit; material; modeling; semiconductor; semiconductor devices; simulation; tables; testing; Electronic Circuits and Systems; Electrical and Electronic Engineering; Elektrotechnik; BC
1 Electrical Overstress in ICS.- 1.1 Definition of Electrostatic Discharge Phenomena.- 1.2 Impact of ESD on IC Chip Technologies.- 1.3 Protection Strategies for Reducing ESD Effects.- 1.4 ESD Models and Qualification.- 1.5 EOS Models and Qualification.- 1.6 Previous Work on ESD/EOS Device Failure Modeling.- 2 NMOS ESD Protection Devices and Process Related Issues.- 2.1 ESD Phenomena in nMOS Devices.- 2.2 Failure Modes in nMOS.- 2.3 Protection Technique Using nMOS Device Structures.- 2.4 The Impact of Process Technologies on nMOS ESD Behavior.- 2.5 Advance nMOS Device Protection Concepts.- 3 Measuring EOS Robustness in ICS.- 3.1 Statistical Distribution of EOS/ESD-related Failures.- 3.2 Characterization of Bipolar Devices.- 3.3 EOS Characterization of nMOS Devices.- 3.4 Summary.- 4 Eos Thermal Failure Simulation for Integrated Circuits.- 4.1 Nomenclature.- 4.2 ITSIM: A Nonlinear Thermal Failure Simulator for ICs.- 4.3 Simulation Results for Ceramic and Plastic Packages.- 4.4 Summary.- 5 ITSIM: A Nonlinear 2D - 1D Thermal Simulator.- 5.1 Introduction.- 5.2 Running the Program.- 5.3 Input File.- 5.4 An Example.- 6 2D Electrothermal Analysis of Device Failure in Mos Processes.- 6.1 Device Level Electrothermal Simulation.- 6.2 Comparison of Experimental and 2D Electrothermal Results.- 6.3 Summary.- 7 Circuit-Level Electrothermal Simulation.- 7.1 Temperature Effects and Device Models.- 7.2 Simulation of Avalanche Breakdown.- 7.3 Temperature Model for Electrothermal Simulation.- 7.4 iETSIM: An Electrothermal Circuit-Level Simulation Tool.- 7.5 Summary.- 8 IETSIM : An Electrothermal Circuit Simulator.- 8.1 Introduction.- 8.2 Running the Program.- 8.3 Input File: Circuit Description and Format.- 8.4 Low Temperature Thermometer Example.- 9 Summary and Future Research.- 9.1 Summary.- 9.2 Future Research.- About the Authors.More/other books that might be very similar to this book
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