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Reliability and Degradation: Semiconductor Devices and Circuits (Wiley Series in Solid State Devices & Circuits) - M. J. Howes, David Vernon Morgan
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M. J. Howes, David Vernon Morgan:

Reliability and Degradation: Semiconductor Devices and Circuits (Wiley Series in Solid State Devices & Circuits) - hardcover

ISBN: 0471280283

[SR: 4756634], Hardcover, [EAN: 9780471280286], John Wiley & Sons Ltd, John Wiley & Sons Ltd, Book, [PU: John Wiley & Sons Ltd], John Wiley & Sons Ltd, Book by Howes, M. J., Morgan, David… More...

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M. J. Howes:

Reliability and Degradation: Semiconductor Devices and Circuits (Wiley Series in Solid State Devices and Circuits) - hardcover

1981, ISBN: 0471280283

[EAN: 9780471280286], Used, good, [SC: 2.48], [PU: Wiley-Blackwell], SCIENCE & TECHNOLOGY, Technology|Electronics|Solid State, This is an ex-library book and may have the usual library/us… More...

  - NOT NEW BOOK. Shipping costs: EUR 2.48 Anybook Ltd., Lincoln, United Kingdom [312675] [Rating: 5 (of 5)]
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M. J. Howes, David Vernon Morgan:
Reliability and Degradation: Semiconductor Devices and Circuits (Wiley Series in Solid State Devices & Circuits) - hardcover

ISBN: 9780471280286

John Wiley & Sons Ltd. Hardcover. POOR. Noticeably used book. Heavy wear to cover. Pages contain marginal notes, underlining, and or highlighting. Possible ex library copy, with all… More...

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M. J. Howes:
Reliability and Degradation: Semiconductor Devices and Circuits (Wiley Series in Solid State Devices and Circuits) - hardcover

1981, ISBN: 9780471280286

Wiley-Blackwell, 1981. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. With usual stamps and markings, In good all ro… More...

  - Shipping costs: EUR 4.92 Anybook Ltd
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Reliability and Degradation, The Wiley Series in Solid State Devices and Circuits - used book

ISBN: 9780471280286

Semiconductor Devices and Circuits Livre - Livre, [PU: Wiley]

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Details of the book
Reliability and Degradation: Semiconductor Devices and Circuits (The Wiley series in solid state devices & circuits)
Author:
Title:
ISBN:

0471280283


Book by Howes, M. J., Morgan, David Vernon

Details of the book - Reliability and Degradation: Semiconductor Devices and Circuits (The Wiley series in solid state devices & circuits)


EAN (ISBN-13): 9780471280286
ISBN (ISBN-10): 0471280283
Hardcover
Publishing year: 1981
Publisher: John Wiley & Sons Ltd

Book in our database since 2008-05-29T03:44:21-04:00 (New York)
Detail page last modified on 2019-06-08T15:24:55-04:00 (New York)
ISBN/EAN: 0471280283

ISBN - alternate spelling:
0-471-28028-3, 978-0-471-28028-6
Alternate spelling and related search-keywords:
Book author: morgan, david howes, vernon
Book title: semiconductor device reliability, solid state devices, degradation, solid state circuits

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