ISBN: 030645324X
[SR: 477277], Taschenbuch, [EAN: 9780306453243], Springer, Springer, Book, [PU: Springer], Springer, 403432, Schule & Lernen, 405500, Allgemeinbildung, 14025941, Berufs- & Fachschulbücher… More...
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ISBN: 030645324X
[SR: 477277], Taschenbuch, [EAN: 9780306453243], Springer, Springer, Book, [PU: Springer], Springer, 403432, Schule & Lernen, 405500, Allgemeinbildung, 14025941, Berufs- & Fachschulbücher… More...
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ISBN: 9780306453243
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2004, ISBN: 030645324X
[EAN: 9780306453243], Used, very good, [PU: Springer], Books
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2004, ISBN: 030645324X
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ISBN: 030645324X
[SR: 477277], Taschenbuch, [EAN: 9780306453243], Springer, Springer, Book, [PU: Springer], Springer, 403432, Schule & Lernen, 405500, Allgemeinbildung, 14025941, Berufs- & Fachschulbücher… More...
David B. Williams, C. Barry Carter:
Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV - PaperbackISBN: 030645324X
[SR: 477277], Taschenbuch, [EAN: 9780306453243], Springer, Springer, Book, [PU: Springer], Springer, 403432, Schule & Lernen, 405500, Allgemeinbildung, 14025941, Berufs- & Fachschulbücher… More...
ISBN: 9780306453243
by Williams, David B.; Carter, C.... | PB | Acceptable, Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) by Williams, David B.; Carter, C. Barry Readable cop… More...
2004, ISBN: 030645324X
[EAN: 9780306453243], Used, very good, [PU: Springer], Books
2004, ISBN: 030645324X
[EAN: 9780306453243], [PU: Springer], pp. 703, Books
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Details of the CD - Transmission Electron Microscopy. A Textbook for Materials Science. Bd. I - IV
EAN (ISBN-13): 9780306453243
ISBN (ISBN-10): 030645324X
Paperback
Publishing year: 1996
Publisher: Springer
703 Pages
Weight: 1,964 kg
Language: eng/Englisch
CD in our database since 2007-04-23T19:18:06-04:00 (New York)
Detail page last modified on 2023-07-04T03:15:08-04:00 (New York)
EAN: 030645324X
EAN - alternate spelling:
0-306-45324-X, 978-0-306-45324-3
Alternate spelling and related search-keywords:
CD artist: david carter, carter william, carter barry, williams and carter
CD title: transmission electron microscopy textbook for materials science
Information from Publisher
Author: David B. Williams; C. Barry Carter
Title: Transmission Electron Microscopy - A Textbook for Materials Science
Publisher: Springer; Springer US
729 Pages
Publishing year: 2004-08-31
New York; NY; US
Printed / Made in
Weight: 1,840 kg
Language: English
85,59 € (DE)
87,99 € (AT)
106,60 CHF (CH)
Not available, publisher indicates OP
BC; Book; Hardcover, Softcover / Physik, Astronomie/Mechanik, Akustik; Spektroskopie, Spektrochemie, Massenspektrometrie; electron microscope; electron microscopy; diffraction; crystal; microscopy; transmission electron microscopy; Helium-Atom-Streuung; materials characterization; B; Physics and Astronomy; Spectroscopy and Microscopy; Surface and Interface Science, Thin Films; Solid State Physics; Characterization and Evaluation of Materials; Biological Microscopy; Wissenschaftliche Ausstattung, Experimente und Techniken; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Spektroskopie, Spektrochemie, Massenspektrometrie; Werkstoffprüfung; Biologie, Biowissenschaften; Wissenschaftliche Ausstattung, Experimente und Techniken; BB; BC
Basics: 1. The Transmission Electron Microscope. 2. Scattering and Diffraction. 3. Elastic Scattering. 4. Inelastic Scattering and Beam Damage. 5. Electron Sources. 6. Lenses, Apertures, and Resolution 7. How to `See' Electrons. 8. Pumps and Holders. 9. The Instrument 10. Specimen Preparation. Diffraction: 11. Diffraction Patterns. 12. Thinking in Reciprocal Space 13. Diffracted Beams. 14. Bloch Waves. 15. Dispersion Surfaces. 16. Diffraction from Crystals. 17. Diffraction from Small Volumes. 18. Indexing Diffraction Patterns. 19. Kikuchi Diffraction. 20. Obtaining CBED Patterns. 21. Using Covergent-Beam Technologies. Imaging: 22. Imaging in the TEM. 23. Thickness and Bending Effects. 24. Planar Defects. 25. Strain Fields. 26. WeakBeam Dark-Field Microscopy. 27. Phase-Contrast Images. 28. High-Resolution TEM. 29. Image Simulation. 30. Quantifying and Processing HRTEM Images. 31. Other Imaging Techniques. Spectrometry: 32. Xray Spectrometry. 33. The XEDS-TEM Interface. 34. Qualitative Xray Analysis. 35. Quantitative Xray Microanalysis. 36. Spatial Resolution and Minimum Detectability. 37. Electron EnergyLoss Spectrometers. 38. The EnergyLoss Spectrum. 39. Microanalysis with Ionization-Loss Electrons. 40. Everything Else in the Spectrum. Index.More/other books that might be very similar to this book
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